Type of Publication: | Journal article |
URI (citable link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-28800 |
Author: | Eisenmenger, Johannes; Schiessling, Joachim; Bolz, Uwe; Runge, Bernd-Uwe; Leiderer, Paul; Lorenz, Michael; Hochmuth, Holger; Wallenhorst, Michael; Dötsch, Horst |
Year of publication: | 1999 |
Published in: | IEEE Transactions on Applied Superconductivity ; 9 (1999), 2. - pp. 1840-1843 |
DOI (citable link): | https://dx.doi.org/10.1109/77.784815 |
Summary: |
Double-sided 3" HTSC Wafers were characterized by the magneto-optic technique. The presented apparatus allows a nondestructive and fast detection of local and extended inhomogeneities in the critical current density with high lateral resolution in the micrometer range. Additional gold-layers on the HTSC wafers, as they are sometmes used for the device production, do not influence the characterization result. The high sensitivity of the presented apparatus allows even the detection of local defects at higher temperature (77 K) where contrasts in the critical current are weaker and the magneto-optical characterization of HTSC thin Alms is milch more difficult than at lower temperatures. So the apparatus can be used even under conditions where cooling with liquid helium or closed-cycle refrigerators is not available. The sensitivity was tested on natural and artificial defects, the latter being prepared by means of a focused laser beam.
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Subject (DDC): | 530 Physics |
Link to License: | Attribution-NonCommercial-NoDerivs 2.0 Generic |
EISENMENGER, Johannes, Joachim SCHIESSLING, Uwe BOLZ, Bernd-Uwe RUNGE, Paul LEIDERER, Michael LORENZ, Holger HOCHMUTH, Michael WALLENHORST, Horst DÖTSCH, 1999. Nondestructive magneto-optical characterization of natural and artificial fefects on 3" HTSC Wafers at liquid nitrogen temperature. In: IEEE Transactions on Applied Superconductivity. 9(2), pp. 1840-1843. Available under: doi: 10.1109/77.784815
@article{Eisenmenger1999Nonde-9421, title={Nondestructive magneto-optical characterization of natural and artificial fefects on 3" HTSC Wafers at liquid nitrogen temperature}, year={1999}, doi={10.1109/77.784815}, number={2}, volume={9}, journal={IEEE Transactions on Applied Superconductivity}, pages={1840--1843}, author={Eisenmenger, Johannes and Schiessling, Joachim and Bolz, Uwe and Runge, Bernd-Uwe and Leiderer, Paul and Lorenz, Michael and Hochmuth, Holger and Wallenhorst, Michael and Dötsch, Horst} }
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