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On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films

On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films

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BONEBERG, Johannes, Paul LEIDERER, 1998. On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films. In: Physica Status Solidi / A. 166(2), pp. 643-650. Available under: doi: 10.1002/(SICI)1521-396X(199804)166:2<643::AID-PSSA643>3.0.CO;2-L

@article{Boneberg1998inter-9401, title={On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films}, year={1998}, doi={10.1002/(SICI)1521-396X(199804)166:2<643::AID-PSSA643>3.0.CO;2-L}, number={2}, volume={166}, journal={Physica Status Solidi / A}, pages={643--650}, author={Boneberg, Johannes and Leiderer, Paul} }

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