Aufgrund von Vorbereitungen auf eine neue Version von KOPS, können am Montag, 6.2. und Dienstag, 7.2. keine Publikationen eingereicht werden. (Due to preparations for a new version of KOPS, no publications can be submitted on Monday, Feb. 6 and Tuesday, Feb. 7.)
Type of Publication: | Journal article |
URI (citable link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-85728 |
Author: | Huska, Klaus; Klatt, Gregor; Hetterich, Jurana; Geyer, Ulf; Dekorsy, Thomas; Bastian, Georg; Lemmer, Uli |
Year of publication: | 2009 |
Published in: | Electronics Letters ; 45 (2009), 16. - pp. 851-853 |
DOI (citable link): | https://dx.doi.org/10.1049/el.2009.1648 |
Summary: |
Interference-lithography and a self-aligning angle-evaporation technique are employed to fabricate interdigitated photoconductive terahertz (THz) emitters. The devices have a large active area for high directivity and submicron spaced electrodes for high internal electric fields at low bias voltages. The fabrication process offers the advantage that only one patterning step is needed to generate three isolated metallic structures. This avoids critical alignment and reduces the fabrication effort significantly. Voltage dependent THz emission is observed from 4 V upwards.
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Subject (DDC): | 530 Physics |
Link to License: | In Copyright |
Bibliography of Konstanz: | Yes |
HUSKA, Klaus, Gregor KLATT, Jurana HETTERICH, Ulf GEYER, Thomas DEKORSY, Georg BASTIAN, Uli LEMMER, 2009. Large-area sub-micron gap interdigitated THz emitters fabricated by interference lithography and angle evaporation. In: Electronics Letters. 45(16), pp. 851-853. Available under: doi: 10.1049/el.2009.1648
@article{Huska2009Large-9287, title={Large-area sub-micron gap interdigitated THz emitters fabricated by interference lithography and angle evaporation}, year={2009}, doi={10.1049/el.2009.1648}, number={16}, volume={45}, journal={Electronics Letters}, pages={851--853}, author={Huska, Klaus and Klatt, Gregor and Hetterich, Jurana and Geyer, Ulf and Dekorsy, Thomas and Bastian, Georg and Lemmer, Uli} }
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/9287"> <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9287/1/ElecLett45200916.pdf"/> <dcterms:issued>2009</dcterms:issued> <dc:language>eng</dc:language> <dc:creator>Hetterich, Jurana</dc:creator> <dc:contributor>Klatt, Gregor</dc:contributor> <dc:rights>terms-of-use</dc:rights> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:55:12Z</dcterms:available> <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/> <dc:creator>Geyer, Ulf</dc:creator> <dc:creator>Klatt, Gregor</dc:creator> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:55:12Z</dc:date> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9287"/> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:contributor>Lemmer, Uli</dc:contributor> <dc:creator>Bastian, Georg</dc:creator> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dcterms:abstract xml:lang="eng">Interference-lithography and a self-aligning angle-evaporation technique are employed to fabricate interdigitated photoconductive terahertz (THz) emitters. The devices have a large active area for high directivity and submicron spaced electrodes for high internal electric fields at low bias voltages. The fabrication process offers the advantage that only one patterning step is needed to generate three isolated metallic structures. This avoids critical alignment and reduces the fabrication effort significantly. Voltage dependent THz emission is observed from 4 V upwards.</dcterms:abstract> <dc:contributor>Huska, Klaus</dc:contributor> <dc:format>application/pdf</dc:format> <dc:creator>Lemmer, Uli</dc:creator> <dc:contributor>Dekorsy, Thomas</dc:contributor> <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9287/1/ElecLett45200916.pdf"/> <dcterms:bibliographicCitation>First publ. in: Electronics Letters 45 (2009), 16, pp. 851-853</dcterms:bibliographicCitation> <dc:contributor>Bastian, Georg</dc:contributor> <dcterms:title>Large-area sub-micron gap interdigitated THz emitters fabricated by interference lithography and angle evaporation</dcterms:title> <dc:contributor>Geyer, Ulf</dc:contributor> <dc:creator>Huska, Klaus</dc:creator> <dc:creator>Dekorsy, Thomas</dc:creator> <dc:contributor>Hetterich, Jurana</dc:contributor> </rdf:Description> </rdf:RDF>
ElecLett45200916.pdf | 609 |