Current Transport at the Atomic Scale

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SCHRÖTER, Ursula, Elke SCHEER, Rainer ARNOLD, Cecile BACCA, Tobias BÖHLER, Jochen GREBING, Patrick KONRAD, Vojko KUNEJ, Ning KANG, Hans-Fridtjof PERNAU, Christian SCHIRM, 2005. Current Transport at the Atomic Scale. In: Advanced Engineering Materials. 7(9), pp. 795-803. ISSN 1438-1656. eISSN 1527-2648

@article{Schroter2005Curre-9225, title={Current Transport at the Atomic Scale}, year={2005}, doi={10.1002/adem.200500101}, number={9}, volume={7}, issn={1438-1656}, journal={Advanced Engineering Materials}, pages={795--803}, author={Schröter, Ursula and Scheer, Elke and Arnold, Rainer and Bacca, Cecile and Böhler, Tobias and Grebing, Jochen and Konrad, Patrick and Kunej, Vojko and Kang, Ning and Pernau, Hans-Fridtjof and Schirm, Christian} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/9225"> <dc:rights>deposit-license</dc:rights> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:54:41Z</dc:date> <dc:contributor>Kang, Ning</dc:contributor> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9225"/> <dc:creator>Kunej, Vojko</dc:creator> <dc:contributor>Böhler, Tobias</dc:contributor> <dc:creator>Schröter, Ursula</dc:creator> <dc:creator>Scheer, Elke</dc:creator> <dc:creator>Bacca, Cecile</dc:creator> <dc:language>eng</dc:language> <dc:creator>Arnold, Rainer</dc:creator> <dc:creator>Grebing, Jochen</dc:creator> <dcterms:title>Current Transport at the Atomic Scale</dcterms:title> <dc:creator>Konrad, Patrick</dc:creator> <dc:contributor>Arnold, Rainer</dc:contributor> <dc:contributor>Pernau, Hans-Fridtjof</dc:contributor> <dc:format>application/pdf</dc:format> <dcterms:abstract xml:lang="eng">Electrical contacts of the width of only one atom can be realized by the break-junction technique. The conductance decreases stepwise due to structural reconfigurations when tearing a nano-bridge in the few-atom range. Transport is described by an ensemble of channels with possibly quite high transmission probabilities. For a single break-junction the last one-atom contact consists of a material-specific channel ensemble, determined by the chemical valance as verified for quite a number of metals. d-electrons in half-metals and spin-effects in magnetic materials will complicate this simple model. Break-junctions also provide ideal contacts to investigate transport through freely suspended clusters or molecules like DNA.</dcterms:abstract> <dc:contributor>Grebing, Jochen</dc:contributor> <dc:contributor>Scheer, Elke</dc:contributor> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:54:41Z</dcterms:available> <dcterms:rights rdf:resource="https://creativecommons.org/licenses/by-nc-nd/2.0/legalcode"/> <dc:creator>Pernau, Hans-Fridtjof</dc:creator> <dc:creator>Schirm, Christian</dc:creator> <dc:creator>Kang, Ning</dc:creator> <dc:contributor>Schröter, Ursula</dc:contributor> <dcterms:issued>2005</dcterms:issued> <dcterms:bibliographicCitation>First publ in: Advanced Engineering Materials 7 (2005), 9, pp. 795-803</dcterms:bibliographicCitation> <dc:contributor>Konrad, Patrick</dc:contributor> <dc:contributor>Schirm, Christian</dc:contributor> <dc:contributor>Kunej, Vojko</dc:contributor> <dc:creator>Böhler, Tobias</dc:creator> <dc:contributor>Bacca, Cecile</dc:contributor> </rdf:Description> </rdf:RDF>

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