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Potentiometry with the acoustic near field microscope : a new method for microscopy of surface potentials

Potentiometry with the acoustic near field microscope : a new method for microscopy of surface potentials

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STEINKE, Rainer, M. HOFFMANN, Mathias BÖHMISCH, Johannes EISENMENGER, Klaus DRANSFELD, Paul LEIDERER, 1997. Potentiometry with the acoustic near field microscope : a new method for microscopy of surface potentials. In: Applied Physics / A, Materials Science and Processing. 64(1), pp. 19-27. Available under: doi: 10.1007/s003390050439

@article{Steinke1997Poten-9159, title={Potentiometry with the acoustic near field microscope : a new method for microscopy of surface potentials}, year={1997}, doi={10.1007/s003390050439}, number={1}, volume={64}, journal={Applied Physics / A, Materials Science and Processing}, pages={19--27}, author={Steinke, Rainer and Hoffmann, M. and Böhmisch, Mathias and Eisenmenger, Johannes and Dransfeld, Klaus and Leiderer, Paul} }

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