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Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction

Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction

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BÖHMISCH, Mathias, Frank BURMEISTER, Armin RETTENBERGER, Jörg ZIMMERMANN, Johannes BONEBERG, Paul LEIDERER, 1997. Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction. In: Journal of Physical Chemistry / B. 101(49), pp. 10162-10165

@article{Bohmisch1997Atomi-9148, title={Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction}, year={1997}, doi={10.1021/jp9728767}, number={49}, volume={101}, journal={Journal of Physical Chemistry / B}, pages={10162--10165}, author={Böhmisch, Mathias and Burmeister, Frank and Rettenberger, Armin and Zimmermann, Jörg and Boneberg, Johannes and Leiderer, Paul} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/9148"> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9148"/> <dcterms:abstract xml:lang="eng">An atomic force microscope (AFM) was utilized as a Kelvin probe to determine work functions of several metals and semiconductors quantitarively. Most of the experimental data show excellent agreement with published values measured by photoemission. Variations in work functions as low as 5 mV could be detected with a typical lateral resolution of 20 nm. This method allowed us to analyze and explain the energetics of an electrochemical reaction on the surface of WSe2, which could be in situ induced and controlled by an externally applied voltage between AFM tip and sample. Thus it could be exploited for etching nanostructures.</dcterms:abstract> <dc:creator>Rettenberger, Armin</dc:creator> <dc:creator>Böhmisch, Mathias</dc:creator> <dcterms:title>Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction</dcterms:title> <dc:format>application/pdf</dc:format> <dc:contributor>Burmeister, Frank</dc:contributor> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:54:02Z</dcterms:available> <dc:creator>Burmeister, Frank</dc:creator> <dc:language>eng</dc:language> <dcterms:rights rdf:resource="https://creativecommons.org/licenses/by-nc-nd/2.0/legalcode"/> <dc:creator>Boneberg, Johannes</dc:creator> <dc:rights>deposit-license</dc:rights> <dcterms:bibliographicCitation>First publ. in: Journal of Physical Chemistry / B, 101 (1997), 49, pp. 10162-10165</dcterms:bibliographicCitation> <dc:contributor>Rettenberger, Armin</dc:contributor> <dc:contributor>Zimmermann, Jörg</dc:contributor> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:54:02Z</dc:date> <dc:creator>Zimmermann, Jörg</dc:creator> <dc:contributor>Boneberg, Johannes</dc:contributor> <dc:creator>Leiderer, Paul</dc:creator> <dc:contributor>Leiderer, Paul</dc:contributor> <dc:contributor>Böhmisch, Mathias</dc:contributor> <dcterms:issued>1997</dcterms:issued> </rdf:Description> </rdf:RDF>

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