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Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction

Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction

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BÖHMISCH, Mathias, Frank BURMEISTER, Armin RETTENBERGER, Jörg ZIMMERMANN, Johannes BONEBERG, Paul LEIDERER, 1997. Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction. In: Journal of Physical Chemistry / B. 101(49), pp. 10162-10165. Available under: doi: 10.1021/jp9728767

@article{Bohmisch1997Atomi-9148, title={Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction}, year={1997}, doi={10.1021/jp9728767}, number={49}, volume={101}, journal={Journal of Physical Chemistry / B}, pages={10162--10165}, author={Böhmisch, Mathias and Burmeister, Frank and Rettenberger, Armin and Zimmermann, Jörg and Boneberg, Johannes and Leiderer, Paul} }

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