Electrical characterization of DNA in mechanically controlled break-junctions
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| Type of Publication: | Journal article |
| URI (citable link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-65330 |
| Author: | Kang, Ning; Erbe, Artur; Scheer, Elke |
| Year of publication: | 2008 |
| Published in: | New Journal of Physics ; 10 (2008). - 023030 |
| DOI (citable link): | https://dx.doi.org/10.1088/1367-2630/10/2/023030 |
| Summary: |
Electrical characterization of DNA molecules using the mechanically controlled break-junction technique is presented. The mainadvantage of the technique is the control over the electrode distance during the measurement. This can be used to stretch the DNA and search for the influence of the conformation on the conduction process. The DNA is characterized in liquid and dry environments. From our data, we conclude that only a small number of molecules are contacted in each measurement.
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| Subject (DDC): | 530 Physics |
| Link to License: | Attribution-NonCommercial-NoDerivs 2.0 Generic |
| Bibliography of Konstanz: | Yes |
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KANG, Ning, Artur ERBE, Elke SCHEER, 2008. Electrical characterization of DNA in mechanically controlled break-junctions. In: New Journal of Physics. 10, 023030. Available under: doi: 10.1088/1367-2630/10/2/023030
@article{Kang2008Elect-9134, title={Electrical characterization of DNA in mechanically controlled break-junctions}, year={2008}, doi={10.1088/1367-2630/10/2/023030}, volume={10}, journal={New Journal of Physics}, author={Kang, Ning and Erbe, Artur and Scheer, Elke}, note={Article Number: 023030} }
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/9134"> <dc:contributor>Erbe, Artur</dc:contributor> <dcterms:issued>2008</dcterms:issued> <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9134/1/Electrical_characterization_of_DNA_in_mechanically_controlled_break_junctions.pdf"/> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9134/1/Electrical_characterization_of_DNA_in_mechanically_controlled_break_junctions.pdf"/> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dcterms:bibliographicCitation>First publ. in: New Journal of Physics 10 (2008), 023030</dcterms:bibliographicCitation> <dc:contributor>Scheer, Elke</dc:contributor> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/52"/> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:creator>Scheer, Elke</dc:creator> <dc:creator>Kang, Ning</dc:creator> <dc:format>application/pdf</dc:format> <dc:creator>Erbe, Artur</dc:creator> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:53:54Z</dcterms:available> <dcterms:rights rdf:resource="http://creativecommons.org/licenses/by-nc-nd/2.0/"/> <dcterms:abstract xml:lang="eng">Electrical characterization of DNA molecules using the mechanically controlled break-junction technique is presented. The mainadvantage of the technique is the control over the electrode distance during the measurement. This can be used to stretch the DNA and search for the influence of the conformation on the conduction process. The DNA is characterized in liquid and dry environments. From our data, we conclude that only a small number of molecules are contacted in each measurement.</dcterms:abstract> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9134"/> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/52"/> <dc:rights>Attribution-NonCommercial-NoDerivs 2.0 Generic</dc:rights> <dc:language>eng</dc:language> <dcterms:title>Electrical characterization of DNA in mechanically controlled break-junctions</dcterms:title> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:53:54Z</dc:date> <dc:contributor>Kang, Ning</dc:contributor> </rdf:Description> </rdf:RDF>
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