Electrical characterization of DNA in mechanically controlled break-junctions
| Publikationstyp: | Zeitschriftenartikel |
| URI (zitierfähiger Link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-65330 |
| Autor/innen: | Kang, Ning; Erbe, Artur; Scheer, Elke |
| Erscheinungsjahr: | 2008 |
| Erschienen in: | New Journal of Physics ; 10 (2008). - 023030 |
| DOI (zitierfähiger Link): | https://dx.doi.org/10.1088/1367-2630/10/2/023030 |
| Zusammenfassung: |
Electrical characterization of DNA molecules using the mechanically controlled break-junction technique is presented. The mainadvantage of the technique is the control over the electrode distance during the measurement. This can be used to stretch the DNA and search for the influence of the conformation on the conduction process. The DNA is characterized in liquid and dry environments. From our data, we conclude that only a small number of molecules are contacted in each measurement.
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| Fachgebiet (DDC): | 530 Physik |
| Link zur Lizenz: | Nutzungsbedingungen |
| Universitätsbibliographie: | Ja |
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KANG, Ning, Artur ERBE, Elke SCHEER, 2008. Electrical characterization of DNA in mechanically controlled break-junctions. In: New Journal of Physics. 10, 023030. Available under: doi: 10.1088/1367-2630/10/2/023030
@article{Kang2008Elect-9134, title={Electrical characterization of DNA in mechanically controlled break-junctions}, year={2008}, doi={10.1088/1367-2630/10/2/023030}, volume={10}, journal={New Journal of Physics}, author={Kang, Ning and Erbe, Artur and Scheer, Elke}, note={Article Number: 023030} }
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