Contact phenomena in 2D electron systems

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SHIKIN, Valeri, Ekkehard TESKE, Paul LEIDERER, Peter WYDER, 1998. Contact phenomena in 2D electron systems. In: Physica / B [Condensed Matter]. 249-251, pp. 660-663

@article{Shikin1998Conta-8999, title={Contact phenomena in 2D electron systems}, year={1998}, doi={10.1016/S0921-4526(98)00283-X}, volume={249-251}, journal={Physica / B [Condensed Matter]}, pages={660--663}, author={Shikin, Valeri and Teske, Ekkehard and Leiderer, Paul and Wyder, Peter} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/8999"> <dcterms:issued>1998</dcterms:issued> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/8999"/> <dcterms:title>Contact phenomena in 2D electron systems</dcterms:title> <dcterms:rights rdf:resource="https://creativecommons.org/licenses/by-nc-nd/2.0/legalcode"/> <dc:format>application/pdf</dc:format> <dc:creator>Leiderer, Paul</dc:creator> <dc:creator>Wyder, Peter</dc:creator> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:52:44Z</dc:date> <dc:contributor>Teske, Ekkehard</dc:contributor> <dc:contributor>Shikin, Valeri</dc:contributor> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:52:44Z</dcterms:available> <dc:creator>Shikin, Valeri</dc:creator> <dc:creator>Teske, Ekkehard</dc:creator> <dc:rights>deposit-license</dc:rights> <dcterms:abstract xml:lang="eng">A promising way ro investigate 2D contact phenomena is proposed. This method is based on the idea of depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid sample containing a 2D-charge carrier system. The density of SSE adjusts to screen contact-induced perturbations or the electrostatic potential across the sample. As a result, the helium layer thickness varies due to the variation of the electrostatic pressure, thus providing a map. This map may be read off interferometrically by a technique already employed for the investigation of multi-electron dimples on helium. We have realized this mapping for a structured electrode as a test sample to dcnmonstrate the resolution of the method.</dcterms:abstract> <dc:language>eng</dc:language> <dc:contributor>Wyder, Peter</dc:contributor> <dc:contributor>Leiderer, Paul</dc:contributor> <dcterms:bibliographicCitation>First publ. in: Physica / B [Condensed Matter], Vols. 249-251 (1998), pp. 660-663</dcterms:bibliographicCitation> </rdf:Description> </rdf:RDF>

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