Cyclotron resonance for two-dimensional electrons on thin helium films
| Publikationstyp: | Zeitschriftenartikel |
| URI (zitierfähiger Link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-27765 |
| Autor/innen: | Klier, Jürgen; Würl, Andreas; Leiderer, Paul; Mistura, Giampaolo; Shikin, Valeri |
| Erscheinungsjahr: | 2002 |
| Erschienen in: | Physical Review B ; 65 (2002). - 165428 |
| DOI (zitierfähiger Link): | https://dx.doi.org/10.1103/PhysRevB.65.165428 |
| Zusammenfassung: |
We present a systematic investigation of the microwave absorption for two-dimensional electron layers on thin helium films and in the presence of a cyclotron resonance (CR) magnetic field. To explain the measured data, a recently proposed two-fraction structure of the electron system is used and here described in detail. Hereby the problem of substrate roughness, usually always present for electrons on thin helium films, is taken into account and it turns out to be an important parameter. Within this model the general structure of the microwave absorption becomes understandable and the fraction of localized and free electrons can be precisely determined. The details of the observed asymmetry and shift of the CR line shape are discussed.
|
| PACS-Klassifikation: | 67.70.+n; 72.10.-d; 73.50.-h; 72.60.+g |
| Fachgebiet (DDC): | 530 Physik |
| Link zur Lizenz: | Nutzungsbedingungen |
Zitieren
Dateien zu dieser Ressource
![[PDF]](/themes/Kops/images/mimes/pdf.png "PDF file"){kind=small}
KLIER, Jürgen, Andreas WÜRL, Paul LEIDERER, Giampaolo MISTURA, Valeri SHIKIN, 2002. Cyclotron resonance for two-dimensional electrons on thin helium films. In: Physical Review B. 65, 165428. Available under: doi: 10.1103/PhysRevB.65.165428
@article{Klier2002Cyclo-8973, title={Cyclotron resonance for two-dimensional electrons on thin helium films}, year={2002}, doi={10.1103/PhysRevB.65.165428}, volume={65}, journal={Physical Review B}, author={Klier, Jürgen and Würl, Andreas and Leiderer, Paul and Mistura, Giampaolo and Shikin, Valeri}, note={Article Number: 165428} }
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/8973"> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dc:creator>Leiderer, Paul</dc:creator> <dc:rights>terms-of-use</dc:rights> <dc:creator>Mistura, Giampaolo</dc:creator> <dc:contributor>Klier, Jürgen</dc:contributor> <dc:contributor>Würl, Andreas</dc:contributor> <dc:contributor>Leiderer, Paul</dc:contributor> <dcterms:abstract xml:lang="eng">We present a systematic investigation of the microwave absorption for two-dimensional electron layers on thin helium films and in the presence of a cyclotron resonance (CR) magnetic field. To explain the measured data, a recently proposed two-fraction structure of the electron system is used and here described in detail. Hereby the problem of substrate roughness, usually always present for electrons on thin helium films, is taken into account and it turns out to be an important parameter. Within this model the general structure of the microwave absorption becomes understandable and the fraction of localized and free electrons can be precisely determined. The details of the observed asymmetry and shift of the CR line shape are discussed.</dcterms:abstract> <dc:contributor>Shikin, Valeri</dc:contributor> <dc:format>application/pdf</dc:format> <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/8973/1/306_physrevB_2002.pdf"/> <dcterms:title>Cyclotron resonance for two-dimensional electrons on thin helium films</dcterms:title> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/8973"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:52:32Z</dc:date> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:creator>Klier, Jürgen</dc:creator> <dcterms:issued>2002</dcterms:issued> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:52:32Z</dcterms:available> <dcterms:rights rdf:resource="https://creativecommons.org/licenses/by-nc-nd/2.0/legalcode"/> <dc:contributor>Mistura, Giampaolo</dc:contributor> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:creator>Würl, Andreas</dc:creator> <dcterms:bibliographicCitation>First publ. in: Physical Review B 65 (2002), Article 165428</dcterms:bibliographicCitation> <dc:creator>Shikin, Valeri</dc:creator> <dc:language>eng</dc:language> <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/8973/1/306_physrevB_2002.pdf"/> </rdf:Description> </rdf:RDF>
Dateiabrufe seit 01.10.2014 (Informationen über die Zugriffsstatistik)
| 306_physrevB_2002.pdf | 70 |
Das Dokument erscheint in:
Solange nicht anders angezeigt, wird die Lizenz wie folgt beschrieben: terms-of-use
KOPS Suche
Stöbern
Mein Benutzerkonto
