X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films

Kiliani, Gillian; Fonin, Mikhail; Voss, Sönke; Rüdiger, Ulrich; Goering, Eberhard

X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films

Files

IEEE_TON44_2008.pdf(278.59 KB)

Date

2008

Authors

Kiliani, Gillian

Fonin, Mikhail

Voss, Sönke

Rüdiger, Ulrich

Goering, Eberhard

Publication type

Journal article

Published in

IEEE Transactions on Magnetics ; 44 (2008), 11. - pp. 2700-2703

Abstract

We investigated Zn0.94Co0.06O thin films on sapphire (0001) substrates with respect to their structural and magnetic properties. X-ray diffraction shows a axis oriented growth and no secondary phases within its resolution. A clear improvement of the crystalline quality was obtained by post annealing under vacuum conditions. Further information about the local electronic structure is obtained by X-ray absorption spectroscopy at the Co L2,3 and the O edge. Magnetic properties were investigated with a superconducting quantum interference device (SQUID) and by X-ray magnetic circular dichroism at the Co L edg2,3e. Both techniques yield mainly paramagnetic behavior of the samples. For low temperatures, an additional small ferromagnetic contribution was observed in SQUID measurements. Several possible origins of this ferromagnetic contribution are discussed.

Subject (DDC)

530 Physics

Keywords

Co-doped ZnO,diluted magnetic semiconductors,XAS,XMCD,ZnO

Cite This

ISO 690

KILIANI, Gillian, Mikhail FONIN, Sönke VOSS, Ulrich RÜDIGER, Eberhard GOERING, 2008. X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films. In: IEEE Transactions on Magnetics. 44(11), pp. 2700-2703. Available under: doi: 10.1109/TMAG.2008.2003064

BibTex

@article{Kiliani2008Spect-8912,
  year={2008},
  doi={10.1109/TMAG.2008.2003064},
  title={X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films},
  number={11},
  volume={44},
  journal={IEEE Transactions on Magnetics},
  pages={2700--2703},
  author={Kiliani, Gillian and Fonin, Mikhail and Voss, Sönke and Rüdiger, Ulrich and Goering, Eberhard}
}

RDF

<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/8912">
    <dcterms:abstract xml:lang="eng">We investigated Zn0.94Co0.06O thin films on sapphire (0001) substrates with respect to their structural and magnetic properties. X-ray diffraction shows a axis oriented growth and no secondary phases within its resolution. A clear improvement of the crystalline quality was obtained by post annealing under vacuum conditions. Further information about the local electronic structure is obtained by X-ray absorption spectroscopy at the Co L2,3 and the O edge. Magnetic properties were investigated with a superconducting quantum interference device (SQUID) and by X-ray magnetic circular dichroism at the Co L edg2,3e. Both techniques yield mainly paramagnetic behavior of the samples. For low temperatures, an additional small ferromagnetic contribution was observed in SQUID measurements. Several possible origins of this ferromagnetic contribution are discussed.</dcterms:abstract>
    <dcterms:issued>2008</dcterms:issued>
    <dc:creator>Goering, Eberhard</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:language>eng</dc:language>
    <dc:contributor>Voss, Sönke</dc:contributor>
    <dc:format>application/pdf</dc:format>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:51:35Z</dc:date>
    <dc:contributor>Goering, Eberhard</dc:contributor>
    <dc:creator>Voss, Sönke</dc:creator>
    <dcterms:rights rdf:resource="http://creativecommons.org/licenses/by-sa/2.0/"/>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/8912"/>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/8912/1/IEEE_TON44_2008.pdf"/>
    <dc:rights>Attribution-ShareAlike 2.0 Generic</dc:rights>
    <dcterms:title>X-Ray Spectroscopic Investigations of Zn 0.94 Co0.06 O Thin Films</dcterms:title>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:creator>Rüdiger, Ulrich</dc:creator>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:contributor>Rüdiger, Ulrich</dc:contributor>
    <dcterms:bibliographicCitation>First publ. in: IEEE Transactions on Magnetics 44 (2008), 11, 2700-2703</dcterms:bibliographicCitation>
    <dc:creator>Kiliani, Gillian</dc:creator>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/8912/1/IEEE_TON44_2008.pdf"/>
    <dc:contributor>Fonin, Mikhail</dc:contributor>
    <dc:contributor>Kiliani, Gillian</dc:contributor>
    <dc:creator>Fonin, Mikhail</dc:creator>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:51:35Z</dcterms:available>
  </rdf:Description>
</rdf:RDF>

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