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An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy

An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy

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BONEBERG, Johannes, Michael OCHMANN, Hans-Joachim MÜNZER, Paul LEIDERER, 1998. An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy. In: Ultramicroscopy. 71(1-4), pp. 345-350. Available under: doi: 10.1016/S0304-3991(97)00064-8

@article{Boneberg1998appro-8866, title={An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy}, year={1998}, doi={10.1016/S0304-3991(97)00064-8}, number={1-4}, volume={71}, journal={Ultramicroscopy}, pages={345--350}, author={Boneberg, Johannes and Ochmann, Michael and Münzer, Hans-Joachim and Leiderer, Paul} }

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