An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy

Boneberg, Johannes; Ochmann, Michael; Münzer, Hans-Joachim; Leiderer, Paul

An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy

Dateien

198_ultramicroscopy_1998.pdfGröße: 296.66 KBDownloads: 317

Datum

1998

Autor:innen

Boneberg, Johannes

Ochmann, Michael

Münzer, Hans-Joachim

Leiderer, Paul

Open Access-Veröffentlichung

Open Access Green

Sammlungen

Physik

Publikationstyp

Zeitschriftenartikel

Publikationsstatus

Published

Erschienen in

Ultramicroscopy. 1998, 71(1-4), pp. 345-350. Available under: doi: 10.1016/S0304-3991(97)00064-8

Zusammenfassung

A new optical setup for plasmon near-field optical microscopes is introduced which allows to improve the signal/background ratio independently of the wavelength used and therefore makes the spectroscopy feasible. Calculated and experimental examples demonstrate this improvement obtained by addition of ellipsometric components. Furthermore, a first measurement in combination with a scanning tunneling microscope shows it is possible to extrude phase information from this setup as well.

Fachgebiet (DDC)

530 Physik

Schlagwörter

NFOM, spectroscopy in NFOM

Zitieren

ISO 690

BONEBERG, Johannes, Michael OCHMANN, Hans-Joachim MÜNZER, Paul LEIDERER, 1998. An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy. In: Ultramicroscopy. 1998, 71(1-4), pp. 345-350. Available under: doi: 10.1016/S0304-3991(97)00064-8

BibTex

@article{Boneberg1998appro-8866,
  year={1998},
  doi={10.1016/S0304-3991(97)00064-8},
  title={An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy},
  number={1-4},
  volume={71},
  journal={Ultramicroscopy},
  pages={345--350},
  author={Boneberg, Johannes and Ochmann, Michael and Münzer, Hans-Joachim and Leiderer, Paul}
}

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