KOPS - Das Institutionelle Repositorium der Universität Konstanz

Fitting of lateral resistances in silicon solar cells to electroluminescence images

Fitting of lateral resistances in silicon solar cells to electroluminescence images

Zitieren

Dateien zu dieser Ressource

Dateien Größe Format Anzeige

Zu diesem Dokument gibt es keine Dateien.

KILIANI, David, Axel HERGUTH, Giso HAHN, Vita RUTKA, Michael JUNK, 2009. Fitting of lateral resistances in silicon solar cells to electroluminescence images. PV SEC. Hamburg, 21. Sep 2009 - 25. Sep 2009. In: Proceedings of the 24th European PV SEC. PV SEC. Hamburg, 21. Sep 2009 - 25. Sep 2009

@inproceedings{Kiliani2009Fitti-796, title={Fitting of lateral resistances in silicon solar cells to electroluminescence images}, year={2009}, booktitle={Proceedings of the 24th European PV SEC}, author={Kiliani, David and Herguth, Axel and Hahn, Giso and Rutka, Vita and Junk, Michael} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/796"> <dc:contributor>Hahn, Giso</dc:contributor> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:48:55Z</dc:date> <dcterms:issued>2009</dcterms:issued> <dc:contributor>Herguth, Axel</dc:contributor> <dc:contributor>Rutka, Vita</dc:contributor> <dcterms:abstract xml:lang="eng">A technique for fast quantitative determination of the different terms contributing to series resistance in a solar cell from electroluminescence (EL) is introduced. A two-dimensional model of the solar cell is presented, which is used to fit the measured luminescence intensities and thereby separate the series resistance contributions of fingers and emitter. First quantitative results of this method for an industrial screen printed monocrystalline silicon solar cell are shown and the influence of lateral diffusion of charge carriers on the measurement is discussed.</dcterms:abstract> <dc:contributor>Kiliani, David</dc:contributor> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:48:55Z</dcterms:available> <dc:creator>Kiliani, David</dc:creator> <dc:creator>Herguth, Axel</dc:creator> <dcterms:rights rdf:resource="http://nbn-resolving.org/urn:nbn:de:bsz:352-20140905103416863-3868037-7"/> <dc:creator>Hahn, Giso</dc:creator> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/796"/> <dc:language>eng</dc:language> <dc:creator>Rutka, Vita</dc:creator> <dc:creator>Junk, Michael</dc:creator> <dcterms:title>Fitting of lateral resistances in silicon solar cells to electroluminescence images</dcterms:title> <dc:contributor>Junk, Michael</dc:contributor> <dcterms:bibliographicCitation>Publ. in: Proceedings of the 24th European PV SEC, Hamburg, 21-25 September 2009</dcterms:bibliographicCitation> <dc:rights>deposit-license</dc:rights> </rdf:Description> </rdf:RDF>

Das Dokument erscheint in:

KOPS Suche


Stöbern

Mein Benutzerkonto