KOPS - Das Institutionelle Repositorium der Universität Konstanz

Angular dependence of the secondary electron emission crystal current : effects of surface modification

Angular dependence of the secondary electron emission crystal current : effects of surface modification

Zitieren

Dateien zu dieser Ressource

Prüfsumme: MD5:bfccd1a118941b684c34ffd2f5a4caba

PEETERS, Frank, E. R. PUCKRIN, Alan J. SLAVIN, 1990. Angular dependence of the secondary electron emission crystal current : effects of surface modification. In: Journal of vacuum science & technology. 8(2), pp. 797-799. ISSN 0734-2101

@article{Peeters1990Angul-7416, title={Angular dependence of the secondary electron emission crystal current : effects of surface modification}, year={1990}, doi={10.1116/1.576920}, number={2}, volume={8}, issn={0734-2101}, journal={Journal of vacuum science & technology}, pages={797--799}, author={Peeters, Frank and Puckrin, E. R. and Slavin, Alan J.} }

2011-03-24T17:34:16Z Slavin, Alan J. Peeters, Frank Slavin, Alan J. 1990 eng Angular dependence of the secondary electron emission crystal current : effects of surface modification deposit-license 2011-03-24T17:34:16Z Peeters, Frank Puckrin, E. R. First publ. in: Journal of vacuum science & technology 8 (1990), 2, pp. 797-799 The variation of the angle between the incident electron beam and sample surface contributes in two ways to the secondary electron emission from single crystals. These contributions are a monotonically varying background due to the changing number ofsecondaries produced near the surface, and an oscillatory component previously explained as a bulk effect related to Kikuchi patterns. This work shows that for emission from a Au(111) surface, the background can be described well by a simple model based on the semiempirical theory of Kanaya and Kawakatsu. It also provides additional support for the explanation of the oscillations as a bulk effect by showing that the oscillation amplitude remains essentially unchanged either by surface sputtering or by the deposition of a thin lead layer. The presence of these oscillations requires some care ill the use of the secondary electron crystal current as a measure of the thickness of thin metal films. Puckrin, E. R. application/pdf

Dateiabrufe seit 01.10.2014 (Informationen über die Zugriffsstatistik)

Angular_dependence_1990.pdf 81

Das Dokument erscheint in:

deposit-license Solange nicht anders angezeigt, wird die Lizenz wie folgt beschrieben: deposit-license

KOPS Suche


Stöbern

Mein Benutzerkonto