Some aspects of quantitative analysis and correction of radiation damage


Dateien zu dieser Ressource

Prüfsumme: MD5:71ae624d16f5c79106b19dcc3dec9f23

DIEDERICHS, Kay, 2006. Some aspects of quantitative analysis and correction of radiation damage. In: Acta Crystallographica, Section D. 62, pp. 96-101. Available under: doi: 10.1107/S0907444905031537

@article{Diederichs2006aspec-6999, title={Some aspects of quantitative analysis and correction of radiation damage}, year={2006}, doi={10.1107/S0907444905031537}, volume={62}, journal={Acta Crystallographica, Section D}, pages={96--101}, author={Diederichs, Kay} }

<rdf:RDF xmlns:dcterms="" xmlns:dc="" xmlns:rdf="" xmlns:bibo="" xmlns:dspace="" xmlns:foaf="" xmlns:void="" xmlns:xsd="" > <rdf:Description rdf:about=""> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:language>eng</dc:language> <dspace:hasBitstream rdf:resource=""/> <dspace:isPartOfCollection rdf:resource=""/> <dcterms:abstract xml:lang="eng">Radiation damage is the major source of systematic error in macromolecular data collected at third-generation synchrotron beamlines. In this paper, a simple way of analysing data for radiation damage is proposed and shown to give results that are easy to interpret. Results of correction of radiation damage obtained with an exponential decay function as implemented in XSCALE (from the XDS package) are shown, and aspects of the mathematical treatment of radiation damage, as well as experimental requirements for the correction and utilization of radiation damage are discussed. Furthermore, a method for quantifying the coverage and evenness of sampling of rotation range is proposed.</dcterms:abstract> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dc:format>application/pdf</dc:format> <dcterms:title>Some aspects of quantitative analysis and correction of radiation damage</dcterms:title> <dcterms:rights rdf:resource=""/> <dc:rights>terms-of-use</dc:rights> <dc:date rdf:datatype="">2011-03-24T17:30:45Z</dc:date> <dcterms:issued>2006</dcterms:issued> <bibo:uri rdf:resource=""/> <dc:contributor>Diederichs, Kay</dc:contributor> <dcterms:isPartOf rdf:resource=""/> <dcterms:hasPart rdf:resource=""/> <dcterms:bibliographicCitation>First publ. in: Acta Crystallographica, Section D 62 (2006), pp. 96-101</dcterms:bibliographicCitation> <dc:creator>Diederichs, Kay</dc:creator> <dcterms:available rdf:datatype="">2011-03-24T17:30:45Z</dcterms:available> </rdf:Description> </rdf:RDF>

Dateiabrufe seit 01.10.2014 (Informationen über die Zugriffsstatistik)

73_Diederichs_Some_aspects_2006.pdf 342

Das Dokument erscheint in:

terms-of-use Solange nicht anders angezeigt, wird die Lizenz wie folgt beschrieben: terms-of-use

KOPS Suche


Mein Benutzerkonto