Magnetic strip patterns induced by focused ion beam irradiation

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MAKAROV, Denys, Stefan TIBUS, Charles T. RETTNER, Tanya THOMSON, Bruce D. TERRIS, Thomas SCHREFL, Manfred ALBRECHT, 2008. Magnetic strip patterns induced by focused ion beam irradiation. In: Journal of Applied Physics. American Institute of Physics (AIP). 103(6), 063915. ISSN 0021-8979. eISSN 1089-7550. Available under: doi: 10.1063/1.2894587

@article{Makarov2008Magne-58692, title={Magnetic strip patterns induced by focused ion beam irradiation}, year={2008}, doi={10.1063/1.2894587}, number={6}, volume={103}, issn={0021-8979}, journal={Journal of Applied Physics}, author={Makarov, Denys and Tibus, Stefan and Rettner, Charles T. and Thomson, Tanya and Terris, Bruce D. and Schrefl, Thomas and Albrecht, Manfred}, note={Article Number: 063915} }

<rdf:RDF xmlns:dcterms="" xmlns:dc="" xmlns:rdf="" xmlns:bibo="" xmlns:dspace="" xmlns:foaf="" xmlns:void="" xmlns:xsd="" > <rdf:Description rdf:about=""> <dc:contributor>Makarov, Denys</dc:contributor> <dc:language>eng</dc:language> <dc:creator>Albrecht, Manfred</dc:creator> <dc:creator>Thomson, Tanya</dc:creator> <dc:contributor>Thomson, Tanya</dc:contributor> <dc:creator>Schrefl, Thomas</dc:creator> <dc:creator>Makarov, Denys</dc:creator> <dcterms:abstract xml:lang="eng">Focused ion beam exposure was used to locally alter the magnetic properties of a continuous Co∕Pd multilayer film with perpendicular magnetic anisotropy. The saturation magnetization, coercivity, and magnetic anisotropy of the films can be tuned by Ga irradiation depending on exposure dose. As a result, a periodic strip pattern consisting of 80nm wide exposed strips which are magnetically soft, separated by 170nm wide magnetically hard, unexposed areas was created. Due to strong magnetostatic coupling between the strips, a number of magnetic domain configurations could be stabilized and these have been observed by magnetic force microscopy and magneto-optic Kerr effect measurements. The magnetic domain configurations and their reversal behavior were investigated by micromagnetic simulations as a function of exposure dose and strip period.</dcterms:abstract> <dc:contributor>Schrefl, Thomas</dc:contributor> <dc:date rdf:datatype="">2022-09-27T12:12:15Z</dc:date> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dcterms:available rdf:datatype="">2022-09-27T12:12:15Z</dcterms:available> <dspace:isPartOfCollection rdf:resource=""/> <bibo:uri rdf:resource=""/> <dc:creator>Tibus, Stefan</dc:creator> <dc:creator>Rettner, Charles T.</dc:creator> <dc:contributor>Rettner, Charles T.</dc:contributor> <dc:contributor>Tibus, Stefan</dc:contributor> <dc:creator>Terris, Bruce D.</dc:creator> <dcterms:issued>2008</dcterms:issued> <dc:contributor>Albrecht, Manfred</dc:contributor> <dcterms:isPartOf rdf:resource=""/> <dcterms:title>Magnetic strip patterns induced by focused ion beam irradiation</dcterms:title> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dc:contributor>Terris, Bruce D.</dc:contributor> </rdf:Description> </rdf:RDF>

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