Hard x-ray photoelectron spectroscopy of tunable oxide interfaces

Cite This

Files in this item

Checksum: MD5:83619876bbf2a3b9e6d8956f3717774e

MÜLLER, Martina, Patrick LÖMKER, Paul ROSENBERGER, Mai HUSSEIN HAMED, David N. MUELLER, Ronja A. HEINEN, Thomas SZYJKA, Lutz BAUMGARTEN, 2022. Hard x-ray photoelectron spectroscopy of tunable oxide interfaces. In: Journal of Vacuum Science and Technology (JVST) A: Vacuum, Surfaces, and Films. American Vacuum Society (AVS). 40(1), 013215. ISSN 0734-2101. eISSN 1520-8559. Available under: doi: 10.1116/6.0001491

@article{Muller2022photo-56308, title={Hard x-ray photoelectron spectroscopy of tunable oxide interfaces}, year={2022}, doi={10.1116/6.0001491}, number={1}, volume={40}, issn={0734-2101}, journal={Journal of Vacuum Science and Technology (JVST) A: Vacuum, Surfaces, and Films}, author={Müller, Martina and Lömker, Patrick and Rosenberger, Paul and Hussein Hamed, Mai and Mueller, David N. and Heinen, Ronja A. and Szyjka, Thomas and Baumgarten, Lutz}, note={Article Number: 013215} }

2022 Lömker, Patrick Szyjka, Thomas 2022-01-24T08:23:41Z Mueller, David N. 2022-01-24T08:23:41Z Hard x-ray photoelectron spectroscopy of tunable oxide interfaces Hussein Hamed, Mai Baumgarten, Lutz Rosenberger, Paul Mueller, David N. Heinen, Ronja A. terms-of-use Müller, Martina Hussein Hamed, Mai Heinen, Ronja A. Szyjka, Thomas Lömker, Patrick eng Müller, Martina The tunability of the oxygen content in complex oxides and heterostructures has emerged as a key to designing their physical functionalities. Controlling the interface reactivity by redox reactions provides a powerful means to deliberately set distinct oxide phases and emerging properties. We present routes on how to control oxygen-driven redox mechanisms in ultrathin ferro(i)magnetic and ferroelectric oxide films and across oxide interfaces. We address the growth and control of metastable EuO oxide phases, the control of phase transitions of binary Fe oxides by oxygen migration, the in operando determination of NiFe<sub>2</sub>O<sub>4</sub>/SrTiO<sub>3</sub> interface band alignments, as well as the role of interfacial oxide exchange in ferroelectric HfO<sub>2</sub> -based capacitors—uncovered by the unique capabilities of photoelectron spectroscopy and, in particular, using hard x-rays. Baumgarten, Lutz Rosenberger, Paul

Downloads since Jan 24, 2022 (Information about access statistics)

Mueller_2-ny3zjebrwf571.pdf 92

This item appears in the following Collection(s)

Search KOPS


Browse

My Account