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FDive : Learning Relevance Models Using Pattern-based Similarity Measures

FDive : Learning Relevance Models Using Pattern-based Similarity Measures

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DENNIG, Frederik L., Tom POLK, Zudi LIN, Tobias SCHRECK, Hanspeter PFISTER, Michael BEHRISCH, 2019. FDive : Learning Relevance Models Using Pattern-based Similarity Measures. 2019 IEEE Conference on Visual Analytics Science and Technology (VAST). Vancouver, BC, Canada, Oct 20, 2019 - Oct 25, 2019. In: 2019 IEEE Conference on Visual Analytics Science and Technology (VAST). Piscataway, NJ:IEEE, pp. 69-80. ISBN 978-1-72812-284-7. Available under: doi: 10.1109/VAST47406.2019.8986940

@inproceedings{Dennig2019FDive-53222, title={FDive : Learning Relevance Models Using Pattern-based Similarity Measures}, year={2019}, doi={10.1109/VAST47406.2019.8986940}, isbn={978-1-72812-284-7}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={2019 IEEE Conference on Visual Analytics Science and Technology (VAST)}, pages={69--80}, author={Dennig, Frederik L. and Polk, Tom and Lin, Zudi and Schreck, Tobias and Pfister, Hanspeter and Behrisch, Michael} }

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