Comparison of electronic structures of mass-selected Ag clusters and thermally grown Ag islands on sputter-damaged graphite surfaces

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2008
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Dietsche, Rainer
Lim, Dong Chan
Bubek, Moritz
Lopez-Salido, Ignacio
Kim, Young Dok
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Applied Physics / A ; 90 (2008). - S. 395-398
Zusammenfassung
Ag cluster anions consisting of 3 16 atoms were deposited on sputter-damaged HOPG surfaces using a soft-landing technique (mean deposition energy less than 0.2 eV/atom) at room temperature. For investigations of the structures of deposited clusters, X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM) were used. In addition, the chemical properties of deposited clusters were studied using atomic oxygen and CO. Comparison of the properties of deposited Ag clusters and Ag islands with similar sizes grown by evaporating Ag atoms on the same substrate shows different results, implying that two different preparation methods give either different shapes of Ag clusters and islands, or dissimilar metal support interactions.
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ISO 690DIETSCHE, Rainer, Dong Chan LIM, Moritz BUBEK, Ignacio LOPEZ-SALIDO, Gerd GANTEFÖR, Young Dok KIM, 2008. Comparison of electronic structures of mass-selected Ag clusters and thermally grown Ag islands on sputter-damaged graphite surfaces. In: Applied Physics / A. 90, pp. 395-398. Available under: doi: 10.1007/s00339-007-4344-7
BibTex
@article{Dietsche2008Compa-5302,
  year={2008},
  doi={10.1007/s00339-007-4344-7},
  title={Comparison of electronic structures of mass-selected Ag clusters and thermally grown Ag islands on sputter-damaged graphite surfaces},
  volume={90},
  journal={Applied Physics / A},
  pages={395--398},
  author={Dietsche, Rainer and Lim, Dong Chan and Bubek, Moritz and Lopez-Salido, Ignacio and Ganteför, Gerd and Kim, Young Dok}
}
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