Transmission increase upon switching VO2 thin films on microstructured surfaces


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KARAKURT, Ismail, Johannes BONEBERG, Paul LEIDERER, Rene LOPEZ, Andrej HALABICA, Richard HAGLUND, 2007. Transmission increase upon switching VO2 thin films on microstructured surfaces. In: Applied Physics Letters. 91, 091907

@article{Karakurt2007Trans-5298, title={Transmission increase upon switching VO2 thin films on microstructured surfaces}, year={2007}, doi={10.1063/1.2776368}, volume={91}, journal={Applied Physics Letters}, author={Karakurt, Ismail and Boneberg, Johannes and Leiderer, Paul and Lopez, Rene and Halabica, Andrej and Haglund, Richard}, note={Article Number: 091907} }

<rdf:RDF xmlns:rdf="" xmlns:bibo="" xmlns:dc="" xmlns:dcterms="" xmlns:xsd="" > <rdf:Description rdf:about=""> <dc:creator>Halabica, Andrej</dc:creator> <dc:creator>Leiderer, Paul</dc:creator> <bibo:uri rdf:resource=""/> <dc:creator>Haglund, Richard</dc:creator> <dc:creator>Boneberg, Johannes</dc:creator> <dcterms:bibliographicCitation>Applied Physics Letters ; 91 (2007). - 091907</dcterms:bibliographicCitation> <dc:rights>deposit-license</dc:rights> <dc:contributor>Leiderer, Paul</dc:contributor> <dc:contributor>Haglund, Richard</dc:contributor> <dcterms:title>Transmission increase upon switching VO2 thin films on microstructured surfaces</dcterms:title> <dc:format>application/pdf</dc:format> <dc:contributor>Halabica, Andrej</dc:contributor> <dcterms:available rdf:datatype="">2011-03-24T14:54:45Z</dcterms:available> <dc:contributor>Lopez, Rene</dc:contributor> <dc:contributor>Boneberg, Johannes</dc:contributor> <dc:creator>Karakurt, Ismail</dc:creator> <dc:creator>Lopez, Rene</dc:creator> <dcterms:issued>2007</dcterms:issued> <dc:contributor>Karakurt, Ismail</dc:contributor> <dc:language>eng</dc:language> <dc:date rdf:datatype="">2011-03-24T14:54:45Z</dc:date> <dcterms:rights rdf:resource=""/> <dcterms:abstract xml:lang="eng">The authors compare transmission measurements of near-infrared light through VO2 thin films on smooth substrates and on ordered arrays of silica microspheres. When the samples are heated above the critical temperature for the semiconductor-metallic phase transition, smooth thin films show reduced transmission independent of thickness: however, the VO2 film deposited on the microspheres may show either reduced or enhanced transmission, depending on VO2 film thickness. They show that this at a first glance, unexpected behavior is directly related to the change of scattering efficiency upon the phase transition. This suggests that optical transmission through thin-film microstructures could be tuned by an appropriate combination of microsphere ordering and VO2 film thickness.</dcterms:abstract> </rdf:Description> </rdf:RDF>

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