DX-behavior of Si in AlN

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ZEISEL, Roland, Martin W. BAYERL, Sebastian T. B. GÖNNENWEIN, Roman DIMITROV, Oliver AMBACHER, Martin S. BRANDT, Martin STUTZMANN, 2000. DX-behavior of Si in AlN. In: Physical Review B. American Physical Society (APS). 61(24), R16283. ISSN 2469-9950. eISSN 2469-9969. Available under: doi: 10.1103/PhysRevB.61.R16283

@article{Zeisel2000DXbeh-52804, title={DX-behavior of Si in AlN}, year={2000}, doi={10.1103/PhysRevB.61.R16283}, number={24}, volume={61}, issn={2469-9950}, journal={Physical Review B}, author={Zeisel, Roland and Bayerl, Martin W. and Gönnenwein, Sebastian T. B. and Dimitrov, Roman and Ambacher, Oliver and Brandt, Martin S. and Stutzmann, Martin}, note={Article Number: R16283} }

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