Generation–recombination noise of DX centers in AlN:Si

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GÖNNENWEIN, Sebastian T. B., Roland ZEISEL, Oliver AMBACHER, Martin S. BRANDT, Martin STUTZMANN, Silvia BALDOVINO, 2001. Generation–recombination noise of DX centers in AlN:Si. In: Applied Physics Letters. American Institute of Physics (AIP). 79(15), pp. 2396-2398. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.1405426

@article{Gonnenwein2001Gener-52556, title={Generation–recombination noise of DX centers in AlN:Si}, year={2001}, doi={10.1063/1.1405426}, number={15}, volume={79}, issn={0003-6951}, journal={Applied Physics Letters}, pages={2396--2398}, author={Gönnenwein, Sebastian T. B. and Zeisel, Roland and Ambacher, Oliver and Brandt, Martin S. and Stutzmann, Martin and Baldovino, Silvia} }

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