Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co<sub>2</sub>MnGa thin films
| Type of Publication: | Journal article |
| Publication status: | Published |
| URI (citable link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-2-17ra2t5jl82l73 |
| Author: | Park, Gyu-Hyeon; Reichlova, Helena; Schlitz, Richard; Lammel, Michaela; Markou, Anastasios; Swekis, Peter; Ritzinger, Philipp; Kriegner, Dominik; Gönnenwein, Sebastian T. B.; Thomas, Andy et al. |
| Year of publication: | 2019 |
| Published in: | Physical Review B ; 101 (2019), 6. - 060406(R). - American Physical Society (APS). - ISSN 2469-9950. - eISSN 2469-9969 |
| ArXiv-ID: | arXiv:1909.10168v2 |
| DOI (citable link): | https://dx.doi.org/10.1103/PhysRevB.101.060406 |
| Summary: |
We report a robust anomalous Nernst effect in Co2MnGa thin films in the thickness regime between 20 and 50 nm. The anomalous Nernst coefficient varied in the range of -2.0 to -3.0 uV/K at 300 K. We demonstrate that the anomalous Hall and Nernst coefficients exhibit similar behavior and fulfill the Mott relation. We simultaneously measure all four transport coefficients of the longitudinal resistivity, transversal resistivity, Seebeck coefficient, and anomalous Nernst coefficient. We connect the values of the measured and calculated Nernst conductivity by using the remaining three magneto-thermal transport coefficients, where the Mott relation is still valid. The intrinsic Berry curvature dominates the transport due to the relation between the longitudinal and transversal transport. Therefore, we conclude that the Mott relationship is applicable to describe the magneto-thermoelectric transport in Weyl semimetal Co2MnGa as a function of film thickness.
|
| Subject (DDC): | 530 Physics |
| Link to License: | Attribution 4.0 International |
| Refereed: | Yes |
Cite This
Files in this item
![[PDF]](/themes/Kops/images/mimes/pdf.png "PDF file"){kind=small}
PARK, Gyu-Hyeon, Helena REICHLOVA, Richard SCHLITZ, Michaela LAMMEL, Anastasios MARKOU, Peter SWEKIS, Philipp RITZINGER, Dominik KRIEGNER, Sebastian T. B. GÖNNENWEIN, Andy THOMAS, 2019. Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co2MnGa thin films. In: Physical Review B. American Physical Society (APS). 101(6), 060406(R). ISSN 2469-9950. eISSN 2469-9969. Available under: doi: 10.1103/PhysRevB.101.060406
@article{Park2019-09-23T05:49:59ZThick-52283, title={Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co2MnGa thin films}, year={2019}, doi={10.1103/PhysRevB.101.060406}, number={6}, volume={101}, issn={2469-9950}, journal={Physical Review B}, author={Park, Gyu-Hyeon and Reichlova, Helena and Schlitz, Richard and Lammel, Michaela and Markou, Anastasios and Swekis, Peter and Ritzinger, Philipp and Kriegner, Dominik and Gönnenwein, Sebastian T. B. and Thomas, Andy}, note={Article Number: 060406(R)} }
Downloads since Jan 5, 2021 (Information about access statistics)
| Park_2-17ra2t5jl82l73.pdf | 166 |
This item appears in the following Collection(s)
Except where otherwise noted, this item's license is described as Attribution 4.0 International
Search KOPS
Browse
My Account
