Quality Metrics for Symmetric Graph Drawings
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| Type of Publication: | Contribution to a conference collection |
| Publication status: | Published |
| URI (citable link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-2-1or2cdmtya1no3 |
| Author: | Meidiana, Amyra; Hong, Seok-Hee; Eades, Peter; Keim, Daniel A. |
| Year of publication: | 2020 |
| Conference: | 2020 IEEE Pacific Visualization Symposium (PacificVis), Jun 3, 2020 - Jun 5, 2020, Tianjin, China |
| Published in: | 2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings / Beck, Fabian et al. (ed.). - Piscataway, NJ : IEEE, 2020. - pp. 11-15. - ISSN 2165-8765. - eISSN 2165-8773. - ISBN 978-1-72815-697-2 |
| DOI (citable link): | https://dx.doi.org/10.1109/PacificVis48177.2020.1022 |
| Summary: |
In this paper, we present a framework for quality metrics that measure symmetry, that is, how faithfully a drawing of a graph displays the ground truth geometric automorphisms as symmetries. The quality metrics are based on group theory as well as geometry. More specifically, we introduce two types of symmetry quality metrics for displaying: (1) a single geometric automorphism as a symmetry (axial or rotational) and (2) a group of geometric automorphisms (cyclic or dihedral). We also present algorithms to compute the symmetry quality metrics in O(n log n) time. We validate our symmetry quality metrics using deformation experiments. We then use the metrics to evaluate existing graph layouts to compare how faithfully they display geometric automorphisms of a graph as symmetries.
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| Subject (DDC): | 004 Computer Science |
| Keywords: | Human-centered computing, Visualization, Visualization techniques, Graph drawing, Visualization design and evaluation methods |
| Link to License: | In Copyright |
| Bibliography of Konstanz: | Yes |
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MEIDIANA, Amyra, Seok-Hee HONG, Peter EADES, Daniel A. KEIM, 2020. Quality Metrics for Symmetric Graph Drawings. 2020 IEEE Pacific Visualization Symposium (PacificVis). Tianjin, China, Jun 3, 2020 - Jun 5, 2020. In: BECK, Fabian, ed. and others. 2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings. Piscataway, NJ:IEEE, pp. 11-15. ISSN 2165-8765. eISSN 2165-8773. ISBN 978-1-72815-697-2. Available under: doi: 10.1109/PacificVis48177.2020.1022
@inproceedings{Meidiana2020Quali-52199, title={Quality Metrics for Symmetric Graph Drawings}, year={2020}, doi={10.1109/PacificVis48177.2020.1022}, isbn={978-1-72815-697-2}, issn={2165-8765}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings}, pages={11--15}, editor={Beck, Fabian}, author={Meidiana, Amyra and Hong, Seok-Hee and Eades, Peter and Keim, Daniel A.} }
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