Quality Metrics for Symmetric Graph Drawings

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MEIDIANA, Amyra, Seok-Hee HONG, Peter EADES, Daniel A. KEIM, 2020. Quality Metrics for Symmetric Graph Drawings. 2020 IEEE Pacific Visualization Symposium (PacificVis). Tianjin, China, Jun 3, 2020 - Jun 5, 2020. In: BECK, Fabian, ed. and others. 2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings. Piscataway, NJ:IEEE, pp. 11-15. ISSN 2165-8765. eISSN 2165-8773. ISBN 978-1-72815-697-2. Available under: doi: 10.1109/PacificVis48177.2020.1022

@inproceedings{Meidiana2020Quali-52199, title={Quality Metrics for Symmetric Graph Drawings}, year={2020}, doi={10.1109/PacificVis48177.2020.1022}, isbn={978-1-72815-697-2}, issn={2165-8765}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings}, pages={11--15}, editor={Beck, Fabian}, author={Meidiana, Amyra and Hong, Seok-Hee and Eades, Peter and Keim, Daniel A.} }

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