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Quality Metrics for Symmetric Graph Drawings

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MEIDIANA, Amyra, Seok-Hee HONG, Peter EADES, Daniel A. KEIM, 2020. Quality Metrics for Symmetric Graph Drawings. 2020 IEEE Pacific Visualization Symposium (PacificVis). Tianjin, China, Jun 3, 2020 - Jun 5, 2020. In: BECK, Fabian, ed. and others. 2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings. Piscataway, NJ:IEEE, pp. 11-15. ISSN 2165-8765. eISSN 2165-8773. ISBN 978-1-72815-697-2. Available under: doi: 10.1109/PacificVis48177.2020.1022

@inproceedings{Meidiana2020Quali-52199, title={Quality Metrics for Symmetric Graph Drawings}, year={2020}, doi={10.1109/PacificVis48177.2020.1022}, isbn={978-1-72815-697-2}, issn={2165-8765}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={2020 IEEE Pacific Visualization Symposium (PacificVis) : Proceedings}, pages={11--15}, editor={Beck, Fabian}, author={Meidiana, Amyra and Hong, Seok-Hee and Eades, Peter and Keim, Daniel A.} }

<rdf:RDF xmlns:dcterms="" xmlns:dc="" xmlns:rdf="" xmlns:bibo="" xmlns:dspace="" xmlns:foaf="" xmlns:void="" xmlns:xsd="" > <rdf:Description rdf:about=""> <dc:contributor>Eades, Peter</dc:contributor> <dc:creator>Meidiana, Amyra</dc:creator> <dc:rights>terms-of-use</dc:rights> <dc:contributor>Meidiana, Amyra</dc:contributor> <dc:creator>Hong, Seok-Hee</dc:creator> <dcterms:issued>2020</dcterms:issued> <dc:creator>Eades, Peter</dc:creator> <dcterms:abstract xml:lang="eng">In this paper, we present a framework for quality metrics that measure symmetry, that is, how faithfully a drawing of a graph displays the ground truth geometric automorphisms as symmetries. The quality metrics are based on group theory as well as geometry. More specifically, we introduce two types of symmetry quality metrics for displaying: (1) a single geometric automorphism as a symmetry (axial or rotational) and (2) a group of geometric automorphisms (cyclic or dihedral). We also present algorithms to compute the symmetry quality metrics in O(n log n) time. We validate our symmetry quality metrics using deformation experiments. We then use the metrics to evaluate existing graph layouts to compare how faithfully they display geometric automorphisms of a graph as symmetries.</dcterms:abstract> <dspace:isPartOfCollection rdf:resource=""/> <dcterms:hasPart rdf:resource=""/> <dcterms:title>Quality Metrics for Symmetric Graph Drawings</dcterms:title> <dcterms:rights rdf:resource=""/> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:contributor>Hong, Seok-Hee</dc:contributor> <bibo:uri rdf:resource=""/> <dc:contributor>Keim, Daniel A.</dc:contributor> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dcterms:isPartOf rdf:resource=""/> <dcterms:available rdf:datatype="">2020-12-21T10:59:31Z</dcterms:available> <dc:language>eng</dc:language> <dc:date rdf:datatype="">2020-12-21T10:59:31Z</dc:date> <dc:creator>Keim, Daniel A.</dc:creator> <dspace:hasBitstream rdf:resource=""/> </rdf:Description> </rdf:RDF>

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