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Attosecond metrology in a continuous-beam transmission electron microscope

Attosecond metrology in a continuous-beam transmission electron microscope

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RYABOV, Andrey, Johannes W. THURNER, David NABBEN, Maxim V. TSAREV, Peter BAUM, 2020. Attosecond metrology in a continuous-beam transmission electron microscope. In: Science Advances. American Association for the Advancement of Science (AAAS). 6(46), eabb1393. eISSN 2375-2548. Available under: doi: 10.1126/sciadv.abb1393

@article{Ryabov2020-11-11Attos-51899, title={Attosecond metrology in a continuous-beam transmission electron microscope}, year={2020}, doi={10.1126/sciadv.abb1393}, number={46}, volume={6}, journal={Science Advances}, author={Ryabov, Andrey and Thurner, Johannes W. and Nabben, David and Tsarev, Maxim V. and Baum, Peter}, note={Article Number: eabb1393} }

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