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Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

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Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

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ALI, Mannan, Christopher H. MARROWS, M. AL-JAWAD, Bryan J. HICKEY, Arkajyoti MISRA, Ulrich NOWAK, Klaus-Dieter USADEL, 2003. Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system. In: Physical Review B. 68, 214420. Available under: doi: 10.1103/PhysRevB.68.214420

@article{Ali2003Antif-4877, title={Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system}, year={2003}, doi={10.1103/PhysRevB.68.214420}, volume={68}, journal={Physical Review B}, author={Ali, Mannan and Marrows, Christopher H. and Al-Jawad, M. and Hickey, Bryan J. and Misra, Arkajyoti and Nowak, Ulrich and Usadel, Klaus-Dieter}, note={Article Number: 214420} }

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