Charge-induced ripplon softening and dimple crystallization at the interface of 3He-4He mixtures

Wanner, Manfred; Leiderer, Paul

Charge-induced ripplon softening and dimple crystallization at the interface of 3He-4He mixtures

Dateien

020_physrevlett_1979.pdfGröße: 659.49 KBDownloads: 283

Datum

1979

Autor:innen

Wanner, Manfred

Leiderer, Paul

Open Access-Veröffentlichung

Open Access Green

Sammlungen

Physik

Publikationstyp

Zeitschriftenartikel

Publikationsstatus

Published

Erschienen in

Physical Review Letters. 1979, 42(5), pp. 315-317. Available under: doi: 10.1103/PhysRevLett.42.315

Zusammenfassung

The interface of phase-separated 3He-4He mixtures, when charged with negative ions, shows a pronounced softening of its ripplon spectrum at wave vectors around the inverse capillary length. As the electrical field perpendicular to the interface is increased beyond a value Ec where the frequency of the soft ripplon vanishes, a phase transition to a spontaneous deformation of the interface in the form of an ordered array of dimples is observed.

Fachgebiet (DDC)

530 Physik

Zitieren

ISO 690

WANNER, Manfred, Paul LEIDERER, 1979. Charge-induced ripplon softening and dimple crystallization at the interface of 3He-4He mixtures. In: Physical Review Letters. 1979, 42(5), pp. 315-317. Available under: doi: 10.1103/PhysRevLett.42.315

BibTex

@article{Wanner1979Charg-4740,
  year={1979},
  doi={10.1103/PhysRevLett.42.315},
  title={Charge-induced ripplon softening and dimple crystallization at the interface of 3He-4He mixtures},
  number={5},
  volume={42},
  journal={Physical Review Letters},
  pages={315--317},
  author={Wanner, Manfred and Leiderer, Paul}
}

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Universitätsbibliographie

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