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Exchange bias in ferromagnetic/antiferromagnetic bilayers with imperfect interfaces

Exchange bias in ferromagnetic/antiferromagnetic bilayers with imperfect interfaces

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Prüfsumme: MD5:2742119205147576c52ff9751be0312b

SPRAY, J., Ulrich NOWAK, 2006. Exchange bias in ferromagnetic/antiferromagnetic bilayers with imperfect interfaces. In: Journal of Physics : D. 39(21), pp. 4536-4539

@article{Spray2006Excha-4650, title={Exchange bias in ferromagnetic/antiferromagnetic bilayers with imperfect interfaces}, year={2006}, doi={10.1088/0022-3727/39/21/003}, number={21}, volume={39}, journal={Journal of Physics : D}, pages={4536--4539}, author={Spray, J. and Nowak, Ulrich} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/4650"> <dc:contributor>Nowak, Ulrich</dc:contributor> <dcterms:bibliographicCitation>Publ. in: Journal of Physics : D ; 39 (2006), 21. - S. 4536-4539</dcterms:bibliographicCitation> <dc:language>eng</dc:language> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T14:49:16Z</dc:date> <dc:format>application/pdf</dc:format> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/4650"/> <dcterms:issued>2006</dcterms:issued> <dc:creator>Nowak, Ulrich</dc:creator> <dcterms:rights rdf:resource="http://nbn-resolving.org/urn:nbn:de:bsz:352-20140905103416863-3868037-7"/> <dc:contributor>Spray, J.</dc:contributor> <dc:creator>Spray, J.</dc:creator> <dcterms:title>Exchange bias in ferromagnetic/antiferromagnetic bilayers with imperfect interfaces</dcterms:title> <dc:rights>deposit-license</dc:rights> <dcterms:abstract xml:lang="eng">The influence of an imperfect interface on exchange bias (EB) properties is investigated. Within the framework of the domain state model, the EB field HEB and the coercive field HC are determined using computer simulations, and they are found to depend strongly on the details of the interface structure. This dependence is sensitive to the dilution of the antiferromagnet (AFM) with non-magnetic defects in the bulk. For the optimal interface structure, giving greatest EB, the optimal dilution is found to be much less than that for an ideal-interface system, taking a value in better agreement with experimental results. Even without any defects in the bulk of the AFM the interface roughness leads to EB for thin antiferromagnetic layers, in accordance with the model by Malozemoff. Finally, the thickness dependence of rough-interface systems is found to differ significantly from that of ideal-interface systems.</dcterms:abstract> </rdf:Description> </rdf:RDF>

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