Comparison of Methods for Classification of Alzheimer's Disease, Frontotemporal Dementia and Asymptomatic Controls
| Type of Publication: | Contribution to a conference collection |
| Publication status: | Published |
| Author: | Wang, Zhijie; Markiewicz, Pawel J.; Platsch, Günther; Kornhuber, Johannes; Kuwert, Torsten; Merhof, Dorit |
| Year of publication: | 2013 |
| Conference: | 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC), Oct 27, 2013 - Nov 2, 2013, Seoul, South Korea |
| Published in: | 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) : Seoul, South Korea, 27 October - 2 November 2013; [in conjunction with the 20th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD)] ; 1. - Piscataway, NJ : IEEE, 2013. - (IEEE Nuclear Science Symposium ; 60). - pp. 194-199. - ISBN 978-1-4799-0532-4 |
| Subject (DDC): | 570 Biosciences, Biology |
| Keywords: | Single photon emission computed tomography (SPECT), Alzheimer's disease (AD), frontotemporal dementia (FTD), multivariate analysis, dimensionality reduction |
| Bibliography of Konstanz: | Yes |
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WANG, Zhijie, Pawel J. MARKIEWICZ, Günther PLATSCH, Johannes KORNHUBER, Torsten KUWERT, Dorit MERHOF, 2013. Comparison of Methods for Classification of Alzheimer's Disease, Frontotemporal Dementia and Asymptomatic Controls. 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC). Seoul, South Korea, Oct 27, 2013 - Nov 2, 2013. In: 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) : Seoul, South Korea, 27 October - 2 November 2013; [in conjunction with the 20th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD)] ; 1. Piscataway, NJ:IEEE, pp. 194-199. ISBN 978-1-4799-0532-4
@inproceedings{Wang2013Compa-42410, title={Comparison of Methods for Classification of Alzheimer's Disease, Frontotemporal Dementia and Asymptomatic Controls}, year={2013}, number={60}, isbn={978-1-4799-0532-4}, address={Piscataway, NJ}, publisher={IEEE}, series={IEEE Nuclear Science Symposium}, booktitle={2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) : Seoul, South Korea, 27 October - 2 November 2013; [in conjunction with the 20th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD)] ; 1}, pages={194--199}, author={Wang, Zhijie and Markiewicz, Pawel J. and Platsch, Günther and Kornhuber, Johannes and Kuwert, Torsten and Merhof, Dorit} }
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