KOPS - The Institutional Repository of the University of Konstanz

Influence of different transition metal contaminations on degradation and regeneration in mc-Si

Influence of different transition metal contaminations on degradation and regeneration in mc-Si

Cite This

Files in this item

Checksum: MD5:4df43943583f9f1c8c5b2eb373489213

SCHMID, Andreas, Annika ZUSCHLAG, Daniel SKORKA, Jakob FRITZ, Clemens WINTER, Giso HAHN, 2017. Influence of different transition metal contaminations on degradation and regeneration in mc-Si. 33rd European Photovoltaic Solar Energy Conference and Exhibition : EU PVSEC 2017. Amsterdam, Sep 25, 2017 - Sep 29, 2017. In: SMETS, Arno, ed. and others. 33rd European Photovoltaic Solar Energy Conference and Exhibition : proceedings of the international conference. München:WIP, pp. 321-324. ISSN 2196-0992. ISBN 3-936338-47-7. Available under: doi: 10.4229/EUPVSEC20172017-2BO.2.2

@inproceedings{Schmid2017Influ-42290, title={Influence of different transition metal contaminations on degradation and regeneration in mc-Si}, year={2017}, doi={10.4229/EUPVSEC20172017-2BO.2.2}, isbn={3-936338-47-7}, issn={2196-0992}, address={München}, publisher={WIP}, booktitle={33rd European Photovoltaic Solar Energy Conference and Exhibition : proceedings of the international conference}, pages={321--324}, editor={Smets, Arno}, author={Schmid, Andreas and Zuschlag, Annika and Skorka, Daniel and Fritz, Jakob and Winter, Clemens and Hahn, Giso} }

<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/42290"> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:creator>Zuschlag, Annika</dc:creator> <dc:creator>Fritz, Jakob</dc:creator> <dc:creator>Skorka, Daniel</dc:creator> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:language>eng</dc:language> <dcterms:title>Influence of different transition metal contaminations on degradation and regeneration in mc-Si</dcterms:title> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:contributor>Winter, Clemens</dc:contributor> <dc:contributor>Schmid, Andreas</dc:contributor> <dc:creator>Schmid, Andreas</dc:creator> <dc:contributor>Hahn, Giso</dc:contributor> <dcterms:abstract xml:lang="eng">Light and elevated temperature induced degradation (LeTID) affects significantly the performance of multicrystalline Silicon (mc-Si) solar cells. The underlying mechanisms of LeTID and following regeneration are still unknown and might depend on contaminations. To investigate the influence of different transition metals on the degradation and regeneration behavior, mc-Si ingots were intentionally contaminated in the Si melt with either 20 ppma Fe, Cu, Cr or a combination of Fe and Cu. Minority charge carrier lifetime (eff) samples were processed and the degradation and regeneration behavior under illumination (0.9 ± 0.1 sun) and elevated temperature (75°C) is measured repetitively by time-resolved photoluminescence imaging (TR-PLI) at room temperature. The resulting minority charge carrier lifetime maps are analyzed and the effective defect concentration within one sample and also for differently contaminated samples were calculated. This approach leads to different defect generation rates for the differently contaminated samples, which might hint to an influence of different transition metals on the LeTID causing defect.</dcterms:abstract> <dc:contributor>Zuschlag, Annika</dc:contributor> <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/42290/3/Schmid_2-16ii24l4rxj250.pdf"/> <dc:contributor>Skorka, Daniel</dc:contributor> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-05-09T13:05:28Z</dc:date> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/42290"/> <dc:creator>Winter, Clemens</dc:creator> <dc:creator>Hahn, Giso</dc:creator> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-05-09T13:05:28Z</dcterms:available> <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/> <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/42290/3/Schmid_2-16ii24l4rxj250.pdf"/> <dc:contributor>Fritz, Jakob</dc:contributor> <dcterms:issued>2017</dcterms:issued> <dc:rights>terms-of-use</dc:rights> </rdf:Description> </rdf:RDF>

Downloads since May 9, 2018 (Information about access statistics)

Schmid_2-16ii24l4rxj250.pdf 41

This item appears in the following Collection(s)

Search KOPS


Browse

My Account