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Investigating possible causes of light induced degradation in boron-doped Float-Zone silicon

Investigating possible causes of light induced degradation in boron-doped Float-Zone silicon

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SPERBER, David, Axel HERGUTH, Giso HAHN, 2017. Investigating possible causes of light induced degradation in boron-doped Float-Zone silicon. 33rd European Photovoltaic Solar Energy Conference and Exhibition : EU PVSEC 2017. Amsterdam, 25. Sep 2017 - 29. Sep 2017. In: SMETS, Arno, ed. and others. 33rd European Photovoltaic Solar Energy Conference and Exhibition : proceedings of the international conference. München:WIP, pp. 565-568. ISSN 2196-0992. ISBN 3-936338-47-7. Available under: doi: 10.4229/EUPVSEC20172017-2AV.1.39

@inproceedings{Sperber2017Inves-42289, title={Investigating possible causes of light induced degradation in boron-doped Float-Zone silicon}, year={2017}, doi={10.4229/EUPVSEC20172017-2AV.1.39}, isbn={3-936338-47-7}, issn={2196-0992}, address={München}, publisher={WIP}, booktitle={33rd European Photovoltaic Solar Energy Conference and Exhibition : proceedings of the international conference}, pages={565--568}, editor={Smets, Arno}, author={Sperber, David and Herguth, Axel and Hahn, Giso} }

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Dateiabrufe seit 09.05.2018 (Informationen über die Zugriffsstatistik)

Sperber_2-8fikcaaxzsji9.pdf 37

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