@inproceedings{Schmidt2013Tempo-42281,
  year={2013},
  doi={10.1109/CLEOE-IQEC.2013.6801033},
  title={Temporal Slicing of Intense Multi-THz Transients Using an Ultrafast Semiconductor Switch},
  isbn={978-1-4799-0594-2},
  publisher={IEEE},
  address={Piscataway, NJ},
  booktitle={Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference (CLEO Europe/IQEC), 2013 : 12 - 16 May 2013, Munich, Germany ; at the World of Photonics Congress 2013},
  author={Schmidt, Christian and Mayer, Bernhard and Bühler, Johannes and Seletskiy, Denis V. and Brida, Daniele and Pashkin, Alexej and Leitenstorfer, Alfred}
}

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    <dc:contributor>Mayer, Bernhard</dc:contributor>
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    <dc:contributor>Bühler, Johannes</dc:contributor>
    <dcterms:abstract xml:lang="eng">Advances in the femtosecond THz opto-electronics have set the stage for a novel class of nonlinear optical experiments exploiting the extreme limits of light-matter interaction. The spectral range of phase-stable multi-THz transients generated by means of difference frequency mixing spans over a multi-octave frequency window. Simultaneously, field-sensitive electro-optic detection provides full access to the temporal pulse shape. Currently, phase-locked multi-THz transients range from multi-cycle waveforms with highest peak electric fields in excess of 100 MV/cm [1] down to a single oscillation of the carrier wave with maximum field above 10 MV/cm [2]. Generally, the interaction length within the emitter crystal yields a trade-off between peak electric field and spectral bandwidth [2]. It would be desirable to combine the advantages of highest peak electric fields and short pulse durations in a single waveform. A promising tool for this purpose is a switching technique based on an ultrafast plasma mirror (UPM)Here, we present a scheme that employs an ultrafast plasma mirror (UPM) to slice intense multi-THz transients from our high-field THz laser source with a sub-cycle precision. For the first time, to the best of our knowledge, the fastest temporal slicing of multi-THz transients is observed using a field-resolved electro-optic detection scheme.</dcterms:abstract>
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    <dc:contributor>Schmidt, Christian</dc:contributor>
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    <dc:creator>Mayer, Bernhard</dc:creator>
    <dc:creator>Leitenstorfer, Alfred</dc:creator>
    <dc:creator>Pashkin, Alexej</dc:creator>
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    <dc:creator>Seletskiy, Denis V.</dc:creator>
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    <dcterms:title>Temporal Slicing of Intense Multi-THz Transients Using an Ultrafast Semiconductor Switch</dcterms:title>
    <dc:creator>Bühler, Johannes</dc:creator>
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    <dc:contributor>Leitenstorfer, Alfred</dc:contributor>
    <dc:contributor>Pashkin, Alexej</dc:contributor>
    <dc:contributor>Seletskiy, Denis V.</dc:contributor>
    <dc:contributor>Brida, Daniele</dc:contributor>
    <dc:creator>Brida, Daniele</dc:creator>
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