Type of Publication: | Contribution to a conference collection |
Publication status: | Published |
URI (citable link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-2-s1xfb1lo5i8w7 |
Author: | Buchmüller, Juri; Jentner, Wolfgang; Streeb, Dirk; Keim, Daniel A. |
Year of publication: | 2017 |
Conference: | 2017 IEEE Visualization Conference (VIS), Oct 1, 2017 - Oct 6, 2017, Phoenix, Arizona, USA |
Published in: | IEEE Conference on Visual Analytics Science and Technology (VAST Challenge 2017 MC1) |
Summary: |
In this paper, we present our solution to the VAST Challenge 2017 Mini Challenge 1. We discuss challenges posed by data set and tasks and introduce ODIX, a custom rapid hypotheses testing system tailored to origin-destination data as provided by the challenge. We show findings made with ODIX and illustrate how we apply sequential pattern mining to explore common traffic patterns.
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Subject (DDC): | 004 Computer Science |
Link to License: | In Copyright |
Bibliography of Konstanz: | Yes |
BUCHMÜLLER, Juri, Wolfgang JENTNER, Dirk STREEB, Daniel A. KEIM, 2017. ODIX : A Rapid Hypotheses Testing System for Origin-Destination Data. 2017 IEEE Visualization Conference (VIS). Phoenix, Arizona, USA, Oct 1, 2017 - Oct 6, 2017. In: IEEE Conference on Visual Analytics Science and Technology (VAST Challenge 2017 MC1)
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