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Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics

Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics

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GROSSMANN, Martin, Martin SCHUBERT, Chuan HE, Delia BRICK, Elke SCHEER, Mike HETTICH, Vitalyi GUSEV, Thomas DEKORSY, 2017. Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics. In: New Journal of Physics. 19(5), 053019. eISSN 1367-2630

@article{Grossmann2017-05-17Chara-39005, title={Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics}, year={2017}, doi={10.1088/1367-2630/aa6d05}, number={5}, volume={19}, journal={New Journal of Physics}, author={Grossmann, Martin and Schubert, Martin and He, Chuan and Brick, Delia and Scheer, Elke and Hettich, Mike and Gusev, Vitalyi and Dekorsy, Thomas}, note={Article Number: 053019} }

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Dateiabrufe seit 22.05.2017 (Informationen über die Zugriffsstatistik)

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