Thermo-voltage measurements of atomic contacts at low temperature

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OFARIM, Ayelet, Bastian KOPP, Thomas B. MÖLLER, León MARTIN, Johannes BONEBERG, Paul LEIDERER, Elke SCHEER, 2016. Thermo-voltage measurements of atomic contacts at low temperature. In: Beilstein Journal of Nanotechnology. 7, pp. 767-775. eISSN 2190-4286. Available under: doi: 10.3762/bjnano.7.68

@article{Ofarim2016-05-30Therm-35187, title={Thermo-voltage measurements of atomic contacts at low temperature}, year={2016}, doi={10.3762/bjnano.7.68}, volume={7}, journal={Beilstein Journal of Nanotechnology}, pages={767--775}, author={Ofarim, Ayelet and Kopp, Bastian and Möller, Thomas B. and Martin, León and Boneberg, Johannes and Leiderer, Paul and Scheer, Elke}, note={We gratefully acknowledge financial support by the Baden-Württemberg Stiftung within the Network of Excellence “Functional Nanostructures”, by the DFG through SFB 767 and by the Alfried Krupp von Bohlen und Halbach Foundation.} }

<rdf:RDF xmlns:dcterms="" xmlns:dc="" xmlns:rdf="" xmlns:bibo="" xmlns:dspace="" xmlns:foaf="" xmlns:void="" xmlns:xsd="" > <rdf:Description rdf:about=""> <dc:contributor>Boneberg, Johannes</dc:contributor> <dspace:isPartOfCollection rdf:resource=""/> <dc:language>eng</dc:language> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dc:contributor>Martin, León</dc:contributor> <dcterms:hasPart rdf:resource=""/> <dc:creator>Kopp, Bastian</dc:creator> <dc:creator>Möller, Thomas B.</dc:creator> <dcterms:rights rdf:resource=""/> <dc:contributor>Scheer, Elke</dc:contributor> <dc:creator>Leiderer, Paul</dc:creator> <dc:creator>Ofarim, Ayelet</dc:creator> <dc:creator>Boneberg, Johannes</dc:creator> <dc:contributor>Möller, Thomas B.</dc:contributor> <dcterms:abstract xml:lang="eng">We report the development of a novel method to determine the thermopower of atomic-sized gold contacts at low temperature. For these measurements a mechanically controllable break junction (MCBJ) system is used and a laser source generates a temperature difference of a few kelvins across the junction to create a thermo-voltage. Since the temperature difference enters directly into the Seebeck coefficient S = -ΔV/ΔT, the determination of the temperature plays an important role. We present a method for the determination of the temperature difference using a combination of a finite element simulation, which reveals the temperature distribution of the sample, and the measurement of the resistance change due to laser heating of sensor leads on both sides next to the junction. Our results for the measured thermopower are in agreement with recent reports in the literature.</dcterms:abstract> <dcterms:issued>2016-05-30</dcterms:issued> <dc:contributor>Kopp, Bastian</dc:contributor> <dc:contributor>Ofarim, Ayelet</dc:contributor> <dc:rights>terms-of-use</dc:rights> <bibo:uri rdf:resource=""/> <dcterms:title>Thermo-voltage measurements of atomic contacts at low temperature</dcterms:title> <dcterms:isPartOf rdf:resource=""/> <dc:contributor>Leiderer, Paul</dc:contributor> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:creator>Martin, León</dc:creator> <dcterms:available rdf:datatype="">2016-09-09T08:51:07Z</dcterms:available> <dspace:hasBitstream rdf:resource=""/> <dc:creator>Scheer, Elke</dc:creator> <dc:date rdf:datatype="">2016-09-09T08:51:07Z</dc:date> </rdf:Description> </rdf:RDF>

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