Recent developments in CrystFEL


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WHITE, Thomas A., Valerio MARIANI, Wolfgang BREHM, Oleksandr YEFANOV, Anton BARTY, Kenneth R. BEYERLEIN, Fedor CHERVINSKII, Chun Hong YOON, Kay DIEDERICHS, Henry N. CHAPMAN, 2016. Recent developments in CrystFEL. In: Journal of Applied Crystallography. 49(2), pp. 680-689. ISSN 0021-8898. eISSN 1600-5767

@article{White2016Recen-33989, title={Recent developments in CrystFEL}, year={2016}, doi={10.1107/S1600576716004751}, number={2}, volume={49}, issn={0021-8898}, journal={Journal of Applied Crystallography}, pages={680--689}, author={White, Thomas A. and Mariani, Valerio and Brehm, Wolfgang and Yefanov, Oleksandr and Barty, Anton and Beyerlein, Kenneth R. and Chervinskii, Fedor and Yoon, Chun Hong and Diederichs, Kay and Chapman, Henry N.} }

<rdf:RDF xmlns:rdf="" xmlns:bibo="" xmlns:dc="" xmlns:dcterms="" xmlns:xsd="" > <rdf:Description rdf:about=""> <dc:contributor>Yoon, Chun Hong</dc:contributor> <dcterms:title>Recent developments in CrystFEL</dcterms:title> <dc:contributor>Chervinskii, Fedor</dc:contributor> <dc:creator>White, Thomas A.</dc:creator> <dc:creator>Beyerlein, Kenneth R.</dc:creator> <dc:creator>Yefanov, Oleksandr</dc:creator> <dc:contributor>Mariani, Valerio</dc:contributor> <dc:contributor>Barty, Anton</dc:contributor> <dc:creator>Yoon, Chun Hong</dc:creator> <dc:creator>Chapman, Henry N.</dc:creator> <dc:contributor>Beyerlein, Kenneth R.</dc:contributor> <dc:contributor>White, Thomas A.</dc:contributor> <dc:creator>Diederichs, Kay</dc:creator> <dc:creator>Chervinskii, Fedor</dc:creator> <dc:creator>Brehm, Wolfgang</dc:creator> <dc:contributor>Yefanov, Oleksandr</dc:contributor> <dcterms:available rdf:datatype="">2016-05-18T10:08:19Z</dcterms:available> <dc:creator>Barty, Anton</dc:creator> <dc:creator>Mariani, Valerio</dc:creator> <dc:contributor>Brehm, Wolfgang</dc:contributor> <bibo:uri rdf:resource=""/> <dcterms:abstract xml:lang="eng">CrystFEL is a suite of programs for processing data from 'serial crystallography' experiments, which are usually performed using X-ray free-electron lasers (FELs) but also increasingly with other X-ray sources. The CrystFEL software suite has been under development since 2009, just before the first hard FEL experiments were performed, and has been significantly updated and improved since then. This article describes the most important improvements which have been made to CrystFEL since the first release version. These changes include the addition of new programs to the suite, the ability to resolve 'indexing ambiguities' and several ways to improve the quality of the integrated data by more accurately modelling the underlying diffraction physics.</dcterms:abstract> <dc:language>eng</dc:language> <dcterms:issued>2016</dcterms:issued> <dc:date rdf:datatype="">2016-05-18T10:08:19Z</dc:date> <dcterms:rights rdf:resource=""/> <dc:contributor>Chapman, Henry N.</dc:contributor> <dc:contributor>Diederichs, Kay</dc:contributor> </rdf:Description> </rdf:RDF>

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