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Formation of defects at the amorphous silicon-crystalline silicon interface during annealing

Formation of defects at the amorphous silicon-crystalline silicon interface during annealing

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PLAGWITZ, Heiko, Barbara TERHEIDEN, Rolf BRENDEL, 2007. Formation of defects at the amorphous silicon-crystalline silicon interface during annealing. 22th European Photovoltaic Solar Energy Conference and Exhibition. Mailand, Sep 3, 2007 - Sep 7, 2007. In: EUPVSEC, , ed.. Proceedings of the international conference : 22nd European Photovoltaic Solar Energy Conference ; held in Milan, Italy, 3 - 7 September 2007. [München]:WIP-Renewable Energies, pp. 936-939. ISBN 3-936338-22-1

@inproceedings{Plagwitz2007Forma-32977, title={Formation of defects at the amorphous silicon-crystalline silicon interface during annealing}, year={2007}, isbn={3-936338-22-1}, address={[München]}, publisher={WIP-Renewable Energies}, booktitle={Proceedings of the international conference : 22nd European Photovoltaic Solar Energy Conference ; held in Milan, Italy, 3 - 7 September 2007}, pages={936--939}, editor={EUPVSEC}, author={Plagwitz, Heiko and Terheiden, Barbara and Brendel, Rolf} }

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