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Staebler-Wronski-like formation of defects at the amorphous-Silicon-crystalline silicon interface during illumination

Staebler-Wronski-like formation of defects at the amorphous-Silicon-crystalline silicon interface during illumination

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PLAGWITZ, Heiko, Barbara TERHEIDEN, Rolf BRENDEL, 2008. Staebler-Wronski-like formation of defects at the amorphous-Silicon-crystalline silicon interface during illumination. In: Journal of Applied Physics. 103(9), 094506. ISSN 0021-8979. eISSN 1089-7550. Available under: doi: 10.1063/1.2913320

@article{Plagwitz2008Staeb-31643, title={Staebler-Wronski-like formation of defects at the amorphous-Silicon-crystalline silicon interface during illumination}, year={2008}, doi={10.1063/1.2913320}, number={9}, volume={103}, issn={0021-8979}, journal={Journal of Applied Physics}, author={Plagwitz, Heiko and Terheiden, Barbara and Brendel, Rolf}, note={Article Number: 094506} }

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