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Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current

Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current

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BUONASSISSI, Tonio, Andrei A. ISTRATOV, Matthew D. PICKETT, Matthew A. MARCUS, Giso HAHN, Stephan RIEPE, Jörg ISENBERG, Wilhelm WARTA, Gerd WILLEKE, Ted f. CISZEK, Eicke R. WEBER, 2005. Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current. In: Applied Physics Letters. 87(4), 044101. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.1997274

@article{Buonassissi2005Quant-31408, title={Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current}, year={2005}, doi={10.1063/1.1997274}, number={4}, volume={87}, issn={0003-6951}, journal={Applied Physics Letters}, author={Buonassissi, Tonio and Istratov, Andrei A. and Pickett, Matthew D. and Marcus, Matthew A. and Hahn, Giso and Riepe, Stephan and Isenberg, Jörg and Warta, Wilhelm and Willeke, Gerd and Ciszek, Ted f. and Weber, Eicke R.}, note={Article Number: 044101} }

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