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Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation

Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation

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BRODY, Joshua, Patric GEIGER, Giso HAHN, Ajeet ROHATGI, 2003. Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation. 3rd World Conference on Photovoltaic Energy Conversion. Osaka, 11. Mai 2003 - 18. Mai 2003. In: KUROKAWA, Kosuke, ed. and others. Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion : joint conference of 13th PV Science & Engineering Conference, 30th IEEE PV Specialists Conference, 18th European PV Solar Energy Conference; Osaka International Congress Center "Grand Cube", Osaka, Japan, 11 - 18 May 2003 ; Vol. 2. 3rd World Conference on Photovoltaic Energy Conversion. Osaka, 11. Mai 2003 - 18. Mai 2003. Osaka:IEEE, pp. 1490-1492. ISBN 4-9901816-0-3

@inproceedings{Brody2003Compa-31212, title={Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation}, year={2003}, isbn={4-9901816-0-3}, address={Osaka}, publisher={IEEE}, booktitle={Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion : joint conference of 13th PV Science & Engineering Conference, 30th IEEE PV Specialists Conference, 18th European PV Solar Energy Conference; Osaka International Congress Center "Grand Cube", Osaka, Japan, 11 - 18 May 2003 ; Vol. 2}, pages={1490--1492}, editor={Kurokawa, Kosuke}, author={Brody, Joshua and Geiger, Patric and Hahn, Giso and Rohatgi, Ajeet} }

Geiger, Patric 2015-06-19T07:53:49Z Rohatgi, Ajeet Hahn, Giso Brody, Joshua Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation eng The effective lifetimes of monocrystalline and multicrystalline wafers were measured under dielectric and iodine-solution surface passivation using inductively coupled photoconductance. While all 18 spots measured on monocrystalline materials had significantly higher (>10%) lifetimes under iodine passivation than dielectric passivation, this condition was satisfied by only 12 of 18 spots measured on cast multicrystalline wafers and just 6 of 18 spots measured on string ribbon. Possible reasons for this behavior are discussed in this paper. Moreover, the differences in surface passivation effectiveness have also been investigated with lifetime maps in order to overcome measurement problems related with the inhomogeneity of ribbon silicon. 2003 Hahn, Giso 2015-06-19T07:53:49Z Brody, Joshua Rohatgi, Ajeet Geiger, Patric

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