KOPS - Das Institutionelle Repositorium der Universität Konstanz

Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation

Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation

Zitieren

Dateien zu dieser Ressource

Prüfsumme: MD5:1133af2b77d3e1a6b705617a76baa6c0

BRODY, Joshua, Patric GEIGER, Giso HAHN, Ajeet ROHATGI, 2003. Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation. 3rd World Conference on Photovoltaic Energy Conversion. Osaka, 11. Mai 2003 - 18. Mai 2003. In: KUROKAWA, Kosuke, ed. and others. Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion : Osaka International Congress Center "Grand Cube", Osaka, Japan, 11 - 18 May 2003 ; Vol. 2. Piscataway, NJ:IEEE, pp. 1490-1492. ISBN 4-9901816-0-3

@inproceedings{Brody2003Compa-31212, title={Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation}, url={https://ieeexplore.ieee.org/document/1306207/}, year={2003}, isbn={4-9901816-0-3}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion : Osaka International Congress Center "Grand Cube", Osaka, Japan, 11 - 18 May 2003 ; Vol. 2}, pages={1490--1492}, editor={Kurokawa, Kosuke}, author={Brody, Joshua and Geiger, Patric and Hahn, Giso and Rohatgi, Ajeet} }

Geiger, Patric terms-of-use 2015-06-19T07:53:49Z Rohatgi, Ajeet Hahn, Giso Brody, Joshua Comparison of dielectrics and iodine solution for monocrystalline and multicrystalline surface passivation eng The effective lifetimes of monocrystalline and multicrystalline wafers were measured under dielectric and iodine-solution surface passivation using inductively coupled photoconductance. While all 18 spots measured on monocrystalline materials had significantly higher (>10%) lifetimes under iodine passivation than dielectric passivation, this condition was satisfied by only 12 of 18 spots measured on cast multicrystalline wafers and just 6 of 18 spots measured on string ribbon. Possible reasons for this behavior are discussed in this paper. Moreover, the differences in surface passivation effectiveness have also been investigated with lifetime maps in order to overcome measurement problems related with the inhomogeneity of ribbon silicon. 2003 2015-06-19T07:53:49Z Hahn, Giso Brody, Joshua Rohatgi, Ajeet Geiger, Patric

Dateiabrufe seit 19.06.2015 (Informationen über die Zugriffsstatistik)

Brody_2-2802h08vnobi9.pdf 2

Das Dokument erscheint in:

KOPS Suche


Stöbern

Mein Benutzerkonto