## Quantum Phase-Slip Junction Under Microwave Irradiation

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2015
##### Authors
Hekking, Frank W. J.
Preprint
##### Abstract
We consider the dynamics of a quantum phase-slip junction (QPSJ) -- a dual Josephson junction -- connected to a microwave source with frequency ωmw. With respect to an ordinary Josephson junction, a QPSJ can sustain dual Shapiro steps, consisting of well-defined current plateaus at multiple integers of eωmw/π in the current-voltage (I-V) characteristic. The experimental observation of these plateaus has been elusive up to now. We argue that thermal as well as quantum fluctuations can smear the I-V characteristic considerably. In order to understand these effects, we study a current-biased QPSJ under microwave irradiation and connected to an inductive and resistive environment. We find that the effect of these fluctuations are governed by the resistance of the environment and by the ratio of the phase-slip energy and the inductive energy. Our results are of interest for experiments aimed at the observation of dual Shapiro steps in QPSJ devices for the definition of a new quantum current standard.
530 Physics
##### Cite This
ISO 690DI MARCO, Angelo, Frank W. J. HEKKING, Gianluca RASTELLI, 2015. Quantum Phase-Slip Junction Under Microwave Irradiation
BibTex
@unpublished{DiMarco2015Quant-31006,
year={2015},
title={Quantum Phase-Slip Junction Under Microwave Irradiation},
author={Di Marco, Angelo and Hekking, Frank W. J. and Rastelli, Gianluca}
}

RDF
<rdf:RDF
xmlns:dcterms="http://purl.org/dc/terms/"
xmlns:dc="http://purl.org/dc/elements/1.1/"
xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
xmlns:bibo="http://purl.org/ontology/bibo/"
xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
xmlns:foaf="http://xmlns.com/foaf/0.1/"
xmlns:void="http://rdfs.org/ns/void#"
xmlns:xsd="http://www.w3.org/2001/XMLSchema#" >
<bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/31006"/>
<dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2015-05-21T09:07:15Z</dcterms:available>
<dc:language>eng</dc:language>
<dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/52"/>
<void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
<dc:creator>Hekking, Frank W. J.</dc:creator>
<dc:contributor>Rastelli, Gianluca</dc:contributor>
<dc:creator>Di Marco, Angelo</dc:creator>
<dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
<dcterms:abstract xml:lang="eng">We consider the dynamics of a quantum phase-slip junction (QPSJ) -- a dual Josephson junction -- connected to a microwave source with frequency ωmw. With respect to an ordinary Josephson junction, a QPSJ can sustain dual Shapiro steps, consisting of well-defined current plateaus at multiple integers of eωmw/π in the current-voltage (I-V) characteristic. The experimental observation of these plateaus has been elusive up to now. We argue that thermal as well as quantum fluctuations can smear the I-V characteristic considerably. In order to understand these effects, we study a current-biased QPSJ under microwave irradiation and connected to an inductive and resistive environment. We find that the effect of these fluctuations are governed by the resistance of the environment and by the ratio of the phase-slip energy and the inductive energy. Our results are of interest for experiments aimed at the observation of dual Shapiro steps in QPSJ devices for the definition of a new quantum current standard.</dcterms:abstract>
<dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
<dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2015-05-21T09:07:15Z</dc:date>
<dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/52"/>
<dc:creator>Rastelli, Gianluca</dc:creator>
<dc:contributor>Di Marco, Angelo</dc:contributor>
<dcterms:title>Quantum Phase-Slip Junction Under Microwave Irradiation</dcterms:title>
<dcterms:issued>2015</dcterms:issued>
<foaf:homepage rdf:resource="http://localhost:8080/"/>
<dc:contributor>Hekking, Frank W. J.</dc:contributor>
</rdf:Description>
</rdf:RDF>

Yes