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Lock-in-thermography investigation of shunts in screen-printed and PERL solar cells

Lock-in-thermography investigation of shunts in screen-printed and PERL solar cells

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BREITENSTEIN, Otwin, Jean P. RAKOTONIAINA, Sven NEVE, Martin A. GREEN, Jianhua ZHAO, Aihua WANG, Giso HAHN, 2002. Lock-in-thermography investigation of shunts in screen-printed and PERL solar cells. 29th IEEE Photovoltaic Specialists Conference. New Orleans, 19. Mai 2002 - 24. Mai 2002. In: INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, , ed.. Conference record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference - 2002 : Hyatt Regency New Orleans, New Orleans, Louisiana, May 19 - 24, 2002. 29th IEEE Photovoltaic Specialists Conference. New Orleans, 19. Mai 2002 - 24. Mai 2002. Piscataway, NJ:IEEE, pp. 430-433. ISBN 0-7803-7471-1. Available under: doi: 10.1109/PVSC.2002.1190551

@inproceedings{Breitenstein2002Locki-30902, title={Lock-in-thermography investigation of shunts in screen-printed and PERL solar cells}, year={2002}, doi={10.1109/PVSC.2002.1190551}, isbn={0-7803-7471-1}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={Conference record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference - 2002 : Hyatt Regency New Orleans, New Orleans, Louisiana, May 19 - 24, 2002}, pages={430--433}, editor={Institute of Electrical and Electronics Engineers}, author={Breitenstein, Otwin and Rakotoniaina, Jean P. and Neve, Sven and Green, Martin A. and Zhao, Jianhua and Wang, Aihua and Hahn, Giso} }

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