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Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells

Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells

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DRESSLER, Katharina, Miriam RAUER, Michael KALOUDIS, Stefan DAUWE, Axel HERGUTH, Giso HAHN, 2015. Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells. In: IEEE Journal of Photovoltaics. 5(1), pp. 70-76. ISSN 2156-3381

@article{Dressler2015Nonde-30732, title={Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells}, year={2015}, doi={10.1109/JPHOTOV.2014.2359745}, number={1}, volume={5}, issn={2156-3381}, journal={IEEE Journal of Photovoltaics}, pages={70--76}, author={Dressler, Katharina and Rauer, Miriam and Kaloudis, Michael and Dauwe, Stefan and Herguth, Axel and Hahn, Giso} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/30732"> <dc:language>eng</dc:language> <dcterms:title>Nondestructive Characterization of Voids in Rear Local Contacts of PERC-Type Solar Cells</dcterms:title> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2015-04-14T09:22:48Z</dcterms:available> <dc:creator>Dauwe, Stefan</dc:creator> <dcterms:rights rdf:resource="http://nbn-resolving.de/urn:nbn:de:bsz:352-20150914100631302-4485392-8"/> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/30732"/> <dc:contributor>Rauer, Miriam</dc:contributor> <dc:contributor>Dauwe, Stefan</dc:contributor> <dcterms:abstract xml:lang="eng">In this paper, we present two nondestructive characterization methods for the detection of voids in rear local contacts of passivated emitter and rear-type solar cells, namely scanning acoustic microscopy and computer tomography. We compare both methods and include a comparison with electroluminescence measurements. It is shown in this paper that voids can easily be detected with both measurement types without any sample preparation. We found a good match of scanning acoustic microscopy (SAM) and computer tomography (CT), which is presented for this purpose for the first time. The investigation was carried out for different aluminum pastes.</dcterms:abstract> <dc:contributor>Hahn, Giso</dc:contributor> <dc:creator>Rauer, Miriam</dc:creator> <dc:creator>Herguth, Axel</dc:creator> <dc:creator>Kaloudis, Michael</dc:creator> <dc:contributor>Herguth, Axel</dc:contributor> <dc:creator>Dressler, Katharina</dc:creator> <dc:creator>Hahn, Giso</dc:creator> <dc:contributor>Dressler, Katharina</dc:contributor> <dc:contributor>Kaloudis, Michael</dc:contributor> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2015-04-14T09:22:48Z</dc:date> <dcterms:issued>2015</dcterms:issued> </rdf:Description> </rdf:RDF>

Dateiabrufe seit 14.04.2015 (Informationen über die Zugriffsstatistik)

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