Defect characterization and investigation of RST-silicon ribbon wafers

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KELLER, Philipp, Annika ZUSCHLAG, Philipp KARZEL, Fabrice DE MORO, Giso HAHN, 2013. Defect characterization and investigation of RST-silicon ribbon wafers. 28th European Photovoltaic Solar Energy Conference and Exhibition. Paris, 30. Sep 2013 - 4. Okt 2013. In: Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2013) ; Paris, France ; conference 30 September - 04 October 2013. 28th European Photovoltaic Solar Energy Conference and Exhibition. Paris, 30. Sep 2013 - 4. Okt 2013. München:WIP, pp. 1512-1517. ISBN 3-936338-33-7. Available under: doi: 10.4229/28thEUPVSEC2013-2BV.3.56

@inproceedings{Keller2013Defec-25269, title={Defect characterization and investigation of RST-silicon ribbon wafers}, year={2013}, doi={10.4229/28thEUPVSEC2013-2BV.3.56}, isbn={3-936338-33-7}, address={München}, publisher={WIP}, booktitle={Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2013) ; Paris, France ; conference 30 September - 04 October 2013}, pages={1512--1517}, author={Keller, Philipp and Zuschlag, Annika and Karzel, Philipp and de Moro, Fabrice and Hahn, Giso} }

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