Transition metal precipitates in mc Si : a new detection method using 3D-FIB

Zitieren

Dateien zu dieser Ressource

Prüfsumme: MD5:b50e39b621a549c77a2a03acfcbed8a7

ZUSCHLAG, Annika, Michail SCHWAB, Dorit MERHOF, Giso HAHN, 2013. Transition metal precipitates in mc Si : a new detection method using 3D-FIB. In: Solid State Phenomena. 205-206, pp. 136-141. ISSN 0377-6883. eISSN 1662-9779

@article{Zuschlag2013Trans-25059, title={Transition metal precipitates in mc Si : a new detection method using 3D-FIB}, year={2013}, doi={10.4028/www.scientific.net/SSP.205-206.136}, volume={205-206}, issn={0377-6883}, journal={Solid State Phenomena}, pages={136--141}, author={Zuschlag, Annika and Schwab, Michail and Merhof, Dorit and Hahn, Giso} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/25059"> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-11-06T20:34:25Z</dcterms:available> <dc:contributor>Schwab, Michail</dc:contributor> <dc:contributor>Zuschlag, Annika</dc:contributor> <dc:creator>Schwab, Michail</dc:creator> <dc:language>eng</dc:language> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/25059"/> <dc:creator>Zuschlag, Annika</dc:creator> <dcterms:issued>2013</dcterms:issued> <dc:contributor>Merhof, Dorit</dc:contributor> <dcterms:title>Transition metal precipitates in mc Si : a new detection method using 3D-FIB</dcterms:title> <dc:rights>deposit-license</dc:rights> <dcterms:abstract xml:lang="eng">To investigate transition metal precipitates in Si, synchrotron based measurements, like micro x-ray fluorescence (μXRF) or detailed transmission electron microscopy (TEM) studies, are usually necessary. Transition metals are among the most detrimental defects in multi-crystalline (mc) silicon material for solar cell applications, due to their impact on minority charge carrier lifetime and possible shunt formation. We present another possibility to investigate transition metal precipitates by 3-dimensional focused ion beam (3D-FIB) cutting using a combined scanning electron microscope (SEM) SEM-FIB-system. This method is able to detect transition metal precipitates down to 5 nm in radius and provides additional information about the 3D shape, size and spatial distribution of the precipitates.</dcterms:abstract> <dcterms:rights rdf:resource="http://nbn-resolving.org/urn:nbn:de:bsz:352-20140905103605204-4002607-1"/> <dcterms:bibliographicCitation>Solid State Phenomena ; (2013), 205-206. - S. 136-141</dcterms:bibliographicCitation> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-11-06T20:34:25Z</dc:date> <dc:creator>Hahn, Giso</dc:creator> <dc:contributor>Hahn, Giso</dc:contributor> <dc:creator>Merhof, Dorit</dc:creator> </rdf:Description> </rdf:RDF>

Dateiabrufe seit 01.10.2014 (Informationen über die Zugriffsstatistik)

Zuschlag_250596.pdf 29

Das Dokument erscheint in:

KOPS Suche


Stöbern

Mein Benutzerkonto