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Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators

Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators

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FAUST, Thomas, Johannes RIEGER, Maximilian J. SEITNER, Jörg P. KOTTHAUS, Eva M. WEIG, 2013. Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators

@unpublished{Faust2013Signa-25032, title={Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators}, year={2013}, author={Faust, Thomas and Rieger, Johannes and Seitner, Maximilian J. and Kotthaus, Jörg P. and Weig, Eva M.} }

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Dateiabrufe seit 01.10.2014 (Informationen über die Zugriffsstatistik)

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