Characterization of ingots and wafers for photovoltaic applications

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GRUBER, Markus, 2012. Characterization of ingots and wafers for photovoltaic applications

@mastersthesis{Gruber2012Chara-20316, title={Characterization of ingots and wafers for photovoltaic applications}, year={2012}, author={Gruber, Markus} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/20316"> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2012-09-10T10:10:51Z</dcterms:available> <dcterms:issued>2012</dcterms:issued> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/20316"/> <dc:creator>Gruber, Markus</dc:creator> <dcterms:abstract xml:lang="eng">Characterization of ingots and wafers is important for quality control and evaluation of new manufacturing processes. On ingots the mechanisms of charge carrier lifetime and resistivity measurements have been investigated, involving the determination of the instrument characteristics. Scheil's equation was confirmed, the iron concentration was determined and boron oxygen defects were detected in the outer layer. The protocols SEMI MF-1188-1107 and SEMI MF-1391-0704 for determination of interstitial oxygen and substitutional carbon concentrations by infrared spectroscopy require sample thicknesses, which exceed common wafer thicknesses. Effects on thinner samples have been studied. We found a relation between resolution, sample thickness and the appearance of interference fringes. Physical and mathematical efforts to get rid of the interferences failed. A recalibration for the conversion coefficients is done for use with lower resolutions. To evaluate defect engineering of interstitial iron, an iron mapping method has been implemented for a Microwave-Photoconductance-Decay device.</dcterms:abstract> <dcterms:title>Characterization of ingots and wafers for photovoltaic applications</dcterms:title> <dcterms:alternative>Charakterisierung von Ingots und Wafern für Anwendungen in der Photovoltaik</dcterms:alternative> <dc:language>eng</dc:language> <dc:rights>deposit-license</dc:rights> <dc:contributor>Gruber, Markus</dc:contributor> <dcterms:rights rdf:resource="http://nbn-resolving.org/urn:nbn:de:bsz:352-20140905103605204-4002607-1"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2012-09-10T10:10:51Z</dc:date> </rdf:Description> </rdf:RDF>

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Bachelor_Gruber.pdf 897

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