Detection limit of XRF measurements at different synchrotron radiation facilities

Zitieren

Dateien zu dieser Ressource

Dateien Größe Format Anzeige

Zu diesem Dokument gibt es keine Dateien.

ZUSCHLAG, Annika, Giso HAHN, 2011. Detection limit of XRF measurements at different synchrotron radiation facilities. 26th European Photovoltaic Solar Energy Conference and Exhibition. CCH Congress Centre and International Fair, Hamburg, Germany, 5. Sep 2011 - 9. Sep 2011. In: OSSENBRINK, H., ed. and others. Proceedings / 26th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC). 26th European Photovoltaic Solar Energy Conference and Exhibition. CCH Congress Centre and International Fair, Hamburg, Germany, 5. Sep 2011 - 9. Sep 2011. Munich, Germany:WIP-Renewable Energies, pp. 1547-1549. ISBN 3-936338-27-2

@inproceedings{Zuschlag2011Detec-18506, title={Detection limit of XRF measurements at different synchrotron radiation facilities}, year={2011}, doi={10.4229/26thEUPVSEC2011-2BV.2.45}, isbn={3-936338-27-2}, address={Munich, Germany}, publisher={WIP-Renewable Energies}, booktitle={Proceedings / 26th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC)}, pages={1547--1549}, editor={Ossenbrink, H.}, author={Zuschlag, Annika and Hahn, Giso} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/18506"> <dc:rights>deposit-license</dc:rights> <dc:contributor>Hahn, Giso</dc:contributor> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2012-02-29T09:28:09Z</dcterms:available> <dcterms:title>Detection limit of XRF measurements at different synchrotron radiation facilities</dcterms:title> <dc:language>eng</dc:language> <dcterms:abstract xml:lang="eng">The only possibility to determine the spatial distribution of transition metal precipitates in silicon wafers without destroying the sample is X-Ray Fluorescence (XRF). The purpose of this work is to evaluate the measurement conditions at different synchrotron radiation facilities. Therefore, we prepared metal test structures with different sizes on the surface of a FZ silicon wafer by electron beam lithography. The investigation of metal particles with a known size and distribution allows the determination of the detection limit at different beamline setups. The gained results are important for further experiments based on synchrotron radiation at different facilities and the evaluation of XRF results. This investigation leads also to an optimization of the measurement setup due to focusing on structures with known shape, which results in improved XRF measurement conditions.</dcterms:abstract> <dcterms:bibliographicCitation>Publ. in: Proceedings : 26th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) ; CCH Congress Centre and International Fair, Hamburg, Germany, Conference 5 - 9 September 2011, exhibition 5 - 8 September 2011 / ed. by H. Ossenbrink ... - München : WIP Renewable Energies, 2011. - S. 1547-1549. - ISBN 3-936338-27-2. - [DVD-ROM]</dcterms:bibliographicCitation> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2012-02-29T09:28:09Z</dc:date> <dc:creator>Zuschlag, Annika</dc:creator> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/18506"/> <dc:contributor>Zuschlag, Annika</dc:contributor> <dcterms:rights rdf:resource="http://nbn-resolving.org/urn:nbn:de:bsz:352-20140905103605204-4002607-1"/> <dcterms:issued>2011</dcterms:issued> <dc:creator>Hahn, Giso</dc:creator> </rdf:Description> </rdf:RDF>

Das Dokument erscheint in:

KOPS Suche


Stöbern

Mein Benutzerkonto