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Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging

Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging

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KILIANI, David, Gabriel MICARD, Benjamin STEUER, Bernd RAABE, Axel HERGUTH, Giso HAHN, 2011. Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging. Melville, NY : American Institute of Physics. In: Journal of Applied Physics. 110(5), 054508. ISSN 0021-8979. Available under: doi: 10.1063/1.3630031

@article{Kiliani2011Minor-16135, title={Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging}, year={2011}, doi={10.1063/1.3630031}, number={5}, volume={110}, issn={0021-8979}, journal={Journal of Applied Physics}, author={Kiliani, David and Micard, Gabriel and Steuer, Benjamin and Raabe, Bernd and Herguth, Axel and Hahn, Giso}, note={Article Number: 054508} }

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