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Time resolved photoluminescence imaging for carrier lifetime mapping of silicon wafers

Time resolved photoluminescence imaging for carrier lifetime mapping of silicon wafers

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KILIANI, David, Gabriel MICARD, Bernd RAABE, Giso HAHN, 2010. Time resolved photoluminescence imaging for carrier lifetime mapping of silicon wafers. 25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion. Valencia, Spain, 6. Sep 2010 - 10. Sep 2010. In: DE SANTI, G.F., ed., H. OSSENBRINK, ed., P. HELM, ed.. 25th European Photovoltaic Solar Energy Conference and Exhibition. 25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion. Valencia, Spain, 6. Sep 2010 - 10. Sep 2010. Munich, Germany:WIP-Renewable Energies, pp. 1363-1366

@inproceedings{Kiliani2010resol-16035, title={Time resolved photoluminescence imaging for carrier lifetime mapping of silicon wafers}, year={2010}, doi={10.4229/25thEUPVSEC2010-2CO.4.2}, address={Munich, Germany}, publisher={WIP-Renewable Energies}, booktitle={25th European Photovoltaic Solar Energy Conference and Exhibition}, pages={1363--1366}, editor={de Santi, G.F. and Ossenbrink, H. and Helm, P.}, author={Kiliani, David and Micard, Gabriel and Raabe, Bernd and Hahn, Giso} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/16035"> <dcterms:bibliographicCitation>Publ. in: 25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion : proceedings of the international conference held 6-10 September 2010, in Valencia, Spain / G.F. de Santi, H. Ossenbrink and P. Helm (eds.). Munich, Germany : WIP-Renewable Energies, 2010. pp. 1363-1366</dcterms:bibliographicCitation> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-10-05T09:38:28Z</dc:date> <dc:creator>Raabe, Bernd</dc:creator> <dc:creator>Kiliani, David</dc:creator> <dc:creator>Hahn, Giso</dc:creator> <dc:contributor>Micard, Gabriel</dc:contributor> <dcterms:rights rdf:resource="http://nbn-resolving.org/urn:nbn:de:bsz:352-20140905103605204-4002607-1"/> <dc:contributor>Kiliani, David</dc:contributor> <dc:creator>Micard, Gabriel</dc:creator> <dc:contributor>Hahn, Giso</dc:contributor> <dcterms:title>Time resolved photoluminescence imaging for carrier lifetime mapping of silicon wafers</dcterms:title> <dc:rights>deposit-license</dc:rights> <dcterms:abstract xml:lang="eng">A method for time-resolved Photoluminescence Imaging using a high-resolution Si-CCD camera was developed. The use of a fast rotating shutter wheel decouples the obtained temporal resolution from the camera exposure time, making it possible to record the decay curve of free minority charge carriers. With this transient measurement, maps of the effective carrier lifetime can be generated for different carrier densities without the use of external calibration measurements.</dcterms:abstract> <dc:contributor>Raabe, Bernd</dc:contributor> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/16035"/> <dc:language>eng</dc:language> <dcterms:issued>2010</dcterms:issued> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-10-05T09:38:28Z</dcterms:available> </rdf:Description> </rdf:RDF>

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