Current noise in molecular junctions : Effects of the electron-phonon interaction


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HAUPT, Federica, Tomáš NOVOTNÝ, Wolfgang BELZIG, 2010. Current noise in molecular junctions : Effects of the electron-phonon interaction. In: Physical Review B. 82(16). ISSN 1098-0121. Available under: doi: 10.1103/PhysRevB.82.165441

@article{Haupt2010Curre-12434, title={Current noise in molecular junctions : Effects of the electron-phonon interaction}, year={2010}, doi={10.1103/PhysRevB.82.165441}, number={16}, volume={82}, issn={1098-0121}, journal={Physical Review B}, author={Haupt, Federica and Novotný, Tomáš and Belzig, Wolfgang} }

<rdf:RDF xmlns:dcterms="" xmlns:dc="" xmlns:rdf="" xmlns:bibo="" xmlns:dspace="" xmlns:foaf="" xmlns:void="" xmlns:xsd="" > <rdf:Description rdf:about=""> <dc:creator>Novotný, Tomáš</dc:creator> <dc:language>eng</dc:language> <dcterms:issued>2010</dcterms:issued> <dcterms:bibliographicCitation>Publ. in: Physical Review B 82 (2010), 165441</dcterms:bibliographicCitation> <dcterms:isPartOf rdf:resource=""/> <dcterms:rights rdf:resource=""/> <dc:date rdf:datatype="">2011-07-07T08:15:21Z</dc:date> <dc:contributor>Novotný, Tomáš</dc:contributor> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:creator>Belzig, Wolfgang</dc:creator> <dc:contributor>Haupt, Federica</dc:contributor> <dc:creator>Haupt, Federica</dc:creator> <dspace:isPartOfCollection rdf:resource=""/> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <bibo:uri rdf:resource=""/> <dcterms:abstract xml:lang="eng">We study inelastic effects on the electronic current noise in molecular junctions, due to the coupling between transport electrons and vibrational degrees of freedom. Using a full counting statistics approach based on the generalized Keldysh Green’s-function technique, we calculate in an unified manner both the mean current and the zero-frequency current noise. For multilevel junctions with weak electron-phonon coupling, we give analytical formulas for the lowest-order inelastic corrections to the noise in terms of universal temperature- and voltage-dependent functions and junction-dependent prefactors, which can be evaluated microscopically, e.g., with ab initio methodologies. We identify distinct terms corresponding to the mean-field contribution to noise and to the vertex corrections, and we show that the latter contribute substantially to the inelastic noise. Finally, we illustrate our results by a simple model of two electronic levels which are mutually coupled by the electron-phonon interaction and show that the inelastic noise spectroscopy is a sensitive diagnostic tool.</dcterms:abstract> <dc:rights>terms-of-use</dc:rights> <dc:contributor>Belzig, Wolfgang</dc:contributor> <dcterms:available rdf:datatype="">2011-07-07T08:15:21Z</dcterms:available> <dcterms:title>Current noise in molecular junctions : Effects of the electron-phonon interaction</dcterms:title> </rdf:Description> </rdf:RDF>

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